The Effects of Limited Data in Multi-Frequency Reflection Diffraction Tomography

  • Mehrdad Soumekh
Conference paper
Part of the NATO ASI Series book series (volume 44)


This paper examines the implications of reconstruction from limited spatial frequency coverage in multi-frequency reflection diffraction tomography. The inversion equation in reflection diffraction tomography is presented. It is shown that the resultant multi-frequency data provides coverage in a one-quadrant of the spatial frequency domain. This coverage yields accurate information regarding the surface structure of the object under study.


Spatial Frequency Tangent Line Fourth Quadrant Diffraction Tomography Receiver Line 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.


Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.


  1. 1.
    M. Kaveh, R.K. Mueller, and R.D. Iverson, “Ultrasonic Tomography Based on Perturbation Solutions of the Wave Equation,” Comput. Graphics Image Proces., April 1979.Google Scholar
  2. 2.
    M. Soumekh and M. Kaveh, “A Theoretical Study of Model Approximation Errors in Diffraction Tomography,” IEEE Trans. on Ultra., Ferro. and Freq. Cont., January 1986.Google Scholar
  3. 3.
    A. Macovski, “Ultrasonic Imaging Using Arrays,” Proc. IEEE, 67: 484, April 1979.CrossRefGoogle Scholar
  4. 4.
    K.C. Tam, “Two-Dimensional Inverse Born Approximation in Ultrasonic Flaw Characterization,” Journal of Nondestructive Evaluation,“ 5: 95, June 1985.CrossRefGoogle Scholar
  5. 5.
    M. Soumekh, “Surface Imaging Via Wave Equation Inversion,” Acoustical Imaging, Vol. 16, 1987.Google Scholar
  6. 6.
    M. Soumekh, “Band-Limited Interpolation from Unevenly-Spaced Sampled Data,” IEEE Trans. on Acoustics, Speech and Signal Processing, January 1988.Google Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 1988

Authors and Affiliations

  • Mehrdad Soumekh
    • 1
  1. 1.Department of Electrical and Computer EngineeringState University of New York at BuffaloAmherstUSA

Personalised recommendations