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The Effects of Limited Data in Multi-Frequency Reflection Diffraction Tomography

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Signal Processing and Pattern Recognition in Nondestructive Evaluation of Materials

Part of the book series: NATO ASI Series ((NATO ASI F,volume 44))

Abstract

This paper examines the implications of reconstruction from limited spatial frequency coverage in multi-frequency reflection diffraction tomography. The inversion equation in reflection diffraction tomography is presented. It is shown that the resultant multi-frequency data provides coverage in a one-quadrant of the spatial frequency domain. This coverage yields accurate information regarding the surface structure of the object under study.

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References

  1. M. Kaveh, R.K. Mueller, and R.D. Iverson, “Ultrasonic Tomography Based on Perturbation Solutions of the Wave Equation,” Comput. Graphics Image Proces., April 1979.

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  2. M. Soumekh and M. Kaveh, “A Theoretical Study of Model Approximation Errors in Diffraction Tomography,” IEEE Trans. on Ultra., Ferro. and Freq. Cont., January 1986.

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  4. K.C. Tam, “Two-Dimensional Inverse Born Approximation in Ultrasonic Flaw Characterization,” Journal of Nondestructive Evaluation,“ 5: 95, June 1985.

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  5. M. Soumekh, “Surface Imaging Via Wave Equation Inversion,” Acoustical Imaging, Vol. 16, 1987.

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  6. M. Soumekh, “Band-Limited Interpolation from Unevenly-Spaced Sampled Data,” IEEE Trans. on Acoustics, Speech and Signal Processing, January 1988.

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Author information

Authors and Affiliations

  1. Department of Electrical and Computer Engineering, State University of New York at Buffalo, Amherst, NY, 14260, USA

    Mehrdad Soumekh

Authors
  1. Mehrdad Soumekh
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Editor information

Editors and Affiliations

  1. Electrical & Computer Engineering Department, Southeastern Massachusetts University, 02747, North Dartmouth, MA, USA

    C. H. Chen

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© 1988 Springer-Verlag Berlin Heidelberg

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Soumekh, M. (1988). The Effects of Limited Data in Multi-Frequency Reflection Diffraction Tomography. In: Chen, C.H. (eds) Signal Processing and Pattern Recognition in Nondestructive Evaluation of Materials. NATO ASI Series, vol 44. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-83422-6_17

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  • DOI: https://doi.org/10.1007/978-3-642-83422-6_17

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-83424-0

  • Online ISBN: 978-3-642-83422-6

  • eBook Packages: Springer Book Archive

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