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Density of States of Landau Levels in Two-Dimensional Systems from Activated Transport, Magnetocapacitance and Gate Current Experiments

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High Magnetic Fields in Semiconductor Physics

Part of the book series: Springer Series in Solid-State Sciences ((SSSOL,volume 71))

Abstract

In this publication we demonstrate that a combination of capacitance and gate current experiments together with an analysis of thermally activated conductivity seems to be useful for the determination of the density of states (DOS) of Landau levels in two-dimensional systems. The experimental results suggest a Landau level width not far away from the predictions of the self-consistent Born approximation (SCBA) if the Fermi level is close to the center of a Landau level. The DOS between Landau levels however cannot be explained with such a narrow linewidth and the experiments suggest the existence of a background DOS or an increased linewidth broadening for integer filling factors.

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References

  1. T. Ando, Y. Uemura: J.Phys.Soc.Jap. 36, 959 (1974)

    Article  ADS  Google Scholar 

  2. R.R. Gerhardts: Surf.Sci. 58, 227 (1976)

    Article  ADS  Google Scholar 

  3. E. Gornik, R. Lassnig, G. Strasser, H.L. Stormer, A.C. Gossard, W. Wiegmann: Phys.Rev.Lett. 54, 1820 (1985)

    Article  ADS  Google Scholar 

  4. J.P. Eisenstein, H.L. Stormer, V. Narayanamurti, A.Y. Cho, A.C. Gossard: Phys.Rev.Lett. 55, 875 (1985)

    Article  ADS  Google Scholar 

  5. E. Stahl, D. Weiss, G. Weimann, K. v.Klitzing, K. Ploog: J.Phys. C18, L783 (1985)

    ADS  Google Scholar 

  6. T.P. Smith, B.B. Goldberg, P.J. Stiles, M. Heiblum: Phys.Rev. B32, 2696 (1985)

    ADS  Google Scholar 

  7. V. Mosser, D. Weiss, K. v.Klitzing, K. Ploog, G. Weimann: Solid State Commun. 58, 5 (1986)

    Article  ADS  Google Scholar 

  8. D. Weiss, TK. v. Klitzing, V. Mosser: in Two-Dimensional Systems: Physics and New Devices, ed. by G. Bauer, F. Kuchar, H. Heinrich, Springer Ser. Solid State Sci., Vol. 67 (Springer, Berlin, Heidelberg 1986) p. 204

    Google Scholar 

  9. T. Ando: J.Phys.Soc.Jap. 53, 3101 (1984)

    Article  ADS  Google Scholar 

  10. S.A. Trugman: Phys.Rev. B27, 7539 (1983)

    ADS  Google Scholar 

  11. F. Stern: Phys.Rev. B5, 4891 (1972)

    ADS  Google Scholar 

  12. R.R. Gerhardts, V. Guimundsson: Phys.kev. B34, 2999 (1986)

    ADS  Google Scholar 

  13. V. Gudmundsson, R.R. Gerhardts: to be published

    Google Scholar 

  14. R. Lassnig, E. Gornik: Solid State Commun. 47, 959 (1983)

    Article  ADS  Google Scholar 

  15. T. Ando, Y. Murayama: J.Phys.Soc. Japan. 54, 1519 (1985)

    Article  ADS  Google Scholar 

  16. W. Cai, T.S. Ting: Phys.Rev. B33, 3967 (1986)

    ADS  Google Scholar 

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© 1987 Springer-Verlag Berlin Heidelberg

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Weiss, D., Klitzing, K. (1987). Density of States of Landau Levels in Two-Dimensional Systems from Activated Transport, Magnetocapacitance and Gate Current Experiments. In: Landwehr, G. (eds) High Magnetic Fields in Semiconductor Physics. Springer Series in Solid-State Sciences, vol 71. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-83114-0_9

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  • DOI: https://doi.org/10.1007/978-3-642-83114-0_9

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-83116-4

  • Online ISBN: 978-3-642-83114-0

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