Abstract
Statistical pattern recognition is now a mature discipline which has been successfully applied in several application domains. The primary goal in statistical pattern recognition is classification, where a pattern vector is assigned to one of a finite number of classes and each class is characterized by a probability density function on the measured features. A pattern vector is viewed as a point in the multidimensional space defined by the features. Design of a recognition system based on this paradigm requires careful attention to the following issues: type of classifier (single-stage vs. hierarchical), feature selection, estimation of classification error, parametric vs. nonparametric decision rules, and utilizing contextual information. Current research emphasis in pattern recognition is on designing efficient algorithms, studying small sample properties of various estimators and decision rules, implementing the algorithms on novel computer architecture, and incorporating context and domain-specific knowledge in decision making.
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References
T. Bailey and A.K. Jain, “A note on distance-weighted K-nearest neighbor rules,” IEEE Trans. Systems, Man, and Cybernetics, Vol. 8, 1978, pp. 311–313.
V.C. Bhavsar, T.Y.T. Chan and L. Goldfarb, “On the metric approach to pattern recognition and VLSI implementation,” Proceedings IEEE Computer Society Workshop on Computer Architecture for Pattern Analysis and Image Data Base Management, Miami Beach, 1985, pp. 126–136.
G. Biswas, A.K. Jain and R. Dubes, “Evaluation of projection algorithms,” IEEE Trans. Pattern Analysis and Machine Intelligence, Vol. 3, 1981, pp. 701–708.
B.B. Chaudhuri, “Application of quadtree, octree, and binary tree decomposition techniques to shape analysis and pattern recognition,” IEEE Trans. Pattern Analysis and Machine Intelligence, Vol. 7, 1985, pp. 652–661.
B. Chandrasekaran, “From numbers to symbols to knowledge structures: Pattern recognition and artificial intelligence perspectives on the classification task,” in Pattern Recognition in Practice, Vol. 2, E.S. Gelsema and L.N. Kanal (Eds.), North Holland, 1986.
Y. Cheng and K.S. Fu, “Conceptual clustering in knowledge organization,” Proceedings First IEEE Conference on Artificial Intelligence Applications, Denver, 1984, pp. 274–279.
M.R. Chernick, V.K. Murthy and C.D. Nealy, “Application of bootstrap and other resampling techniques: Evaluation of classifier performance,” Pattern Recognition Letters, Vol. 3, 1985, pp. 167–178.
D.K.Y. Chiu and A.K.C. Wong, “Synthesizing knowledge: A cluster analysis approach using event covering,” to appear in IEEE Trans. Systems, Man, and Cybernetics, 1986.
P.R. Cohen, Heuristic Reasoning About Uncertainty: An Artificial Intelligence Approach, Pitman, 1985.
T. M. Cover and J. M. Van Campenhout, “On the Possible orderings in the measurement selection Problem,” IEEE Trans. Systems, Man and Cybernetics, Vol. 7, 1977, pp. 657–661.
G.R. Dattatreya and L.N. Kanal, “Decision trees in pattern recognition,” Technical Report TR-1429, Machine Intelligence and Pattern Analysis Laboratory, University of Maryland, 1985.
W.H.E. Day and R.S. Wells, “Extremes in the complexity of computing metric distances between partitions,” IEEE Trans. Pattern Analysis and Machine Intelligence, Vol. 6, 1984, pp. 69–73.
P.A. Devijver and M. Dekesel, “Insert and delete algorithms for maintaining dynamic Delaunay triangulations,” Pattern Recognition Letters, Vol. 1, 1982, pp. 73–77.
P. Devijver and J. Kittler, Statistical Pattern Recognition, Prentice Hall, 1982.
L. Devroye and F. Machell, “Data structures in kernel density estimation,” IEEE Trans. Pattern Analysis and Machine Intelligence, Vol. 7, 1985, pp. 360–366.
R. Dubes and A. K. Jain, “Clustering methodology in exploratory data analysis,” in Advances in Computers, Vol. 19, M. Yovits (Ed.), Academic Press, 1980.
R. Dubes and A. K. Jain, “Validity studies in clustering methodology,” Pattern Recognition, Vol. 11, 1979, pp. 235–254.
R. O. Duda and P. E. Hart, Pattern Classification and Scene Analysis, Wiley, New-York, 1973.
B. Efron, “Estimating the error rate of the prediction rule: Improvements on cross validation, J AS A, Vol. 78, 1983, pp. 316–331.
B. Efron, “The jackknife, the bootstrap and other resampling plans”, Society for Industrial and Applied Mathematics, Philadelphia, 1982.
A. H. Feiveson, “Classification by thresholding,” IEEE Trans. Pattern Analysis and Machine Intelligence, Vol. 5, Jan. 1983, pp. 48–54.
D.H. Foley, “Consideration of sample and feature size,” IEEE Trans. Information Theory, Vol. 18, 1982, pp. 618–626.
K.S. Fu, “A step towards unification of syntactic and statistical pattern recognition,” IEEE Trans. Pattern Analysis and Machine Intelligence, Vol. 8, 1986, pp. 398–404.
K.S. Fu (Editor), VLSI for Pattern Recognition and Image Processing, Springer Verlag, 1984.
K.S. Fu (Editor), Applications of Pattern Recognition, CRC Press, 1982.
K.S. Fu, Syntactic Pattern Recognition and Applications, Prentice Hall, 1982.
K. Fukunaga and D.M. Hummels, “Bias of nearest neighbor error estimates,” to appear in IEEE Trans, on Pattern Analysis and Machine Intelligence, 1986.
K. Fukunaga and T.E. Flick, “A test of the Gaussian-ness of a data set using clustering,” IEEE Trans. Pattern Analysis and Machine Intelligence, Vol. 8, 1986, pp. 240–247.
K. Fukunaga and T.E. Flick, “Classification error for a very large number of classes,” IEEE Trans. Pattern Analysis and Machine Intelligence, Vol. 6, 1984, pp. 779–788.
K. Fukunaga and T. Flick, “An optimal global nearest neighbor metric,” IEEE Trans. Pattern Analysis and Machine Intelligence, Vol. 6, 1984, pp. 314–318.
K. Fukunaga and J.M. Mantock, “Nonparametric discriminant analysis,” IEEE Trans. Pattern Analysis and Machine Intelligence, Vol. 5, 1983, pp. 671–678.
K. Fukunaga and S. Ando, “The optimum nonlinear features for a scatter criterion in discriminant analysis,” IEEE Trans. Information Theory, Vol. 23, 1977, pp. 453–459.
K. Fukunaga and R.D. Short, “Generalized clustering for problem localization,” IEEE Trans. Computers, Vol. 27, 1978, pp. 176–181.
T.D. Garvey, J.D. Lawrence and M.A. Fishier, “An inference technique for integrating knowledge from disparate sources,” Proceedings IJCAI, Vancouver, 1981, pp. 319–325.
R.C. Gonzalez and M.G. Thomason, Syntactic Pattern Recognition: An Introduction, Addison-Wesley, 1978.
P. Hall, “Large sample optimality of least squares cross-validation in density estimation,” Annals of Statistics, Vol. 11, 1983, pp. 1156–1174.
J. Haslett, “Maximum likelihood discriminant analysis on the plane using a Markovian model of spatial context,” Pattern Recognition Journal, Vol. 18, 1985, pp. 287–296.
J.J. Hull, S.N. Srihari and R. Choudhari, “An integrated algorithm for text recognition: Comparison with a cascaded algorithm,” IEEE Trans. Pattern Analysis and Machine Intelligence, Vol. 5, 1983, pp. 384–395.
A. K. Jain and B. Chandrasekaran, “Dimensionality and sample size consideration in pattern recognition practice,” in Handbook of Statistics, Vol. 2, P. R. Krishnaiah and L. N. Kanal (Eds.), North Holland, 1982, pp. 835–855.
A.K. Jain, R.C. Dubes and C.C. Chen, “Bootstrap techniques for error estimation,” submitted to IEEE Trans. Pattern Analysis and Machine Intelligence, 1986.
M.M. Kalayeh and D.A. Landgrebe, “Predicting the required number of training samples,” IEEE Trans. Pattern Analysis and Machine Intelligence, Vol. 5, November 1983, pp. 664–667.
M. Kallay, “Convex hull made easy,” Information Processing Letters, Vol. 22, 1986, pp. 161.
B. Kamgar-Parsi and L.N. Kanal, “An improved branch and bound algorithm for computing k-nearest neighbors,” Pattern Recognition Letters, Vol. 3, 1985, pp. 7–12.
J.P. Keating and R.L. Mason, “Some practical aspects of covariance estimation,” Pattern Recognition Letters, Vol. 3, 1985, pp. 295–298.
V. Kumar and L.N. Kanal, “Parallel branch-and-bound formulation for AND/OR tree search,” IEEE Trans. Pattern Analysis and Machine Intelligence, Vol. 6, 1984, pp. 768–778.
D. T. Lee and F. P. Preparata, “Computational geometry: A survey,” IEEE Trans. Computers, Vol. 33, 1984, pp. 1072–1101.
X. Li and R. Dubes, “A new statistic for tree classifier design,” to appear in Pattern Recognition, 1986.
W. Maline, “On an extended Fisher criterion for feature selection,” IEEE Trans. Pattern Analysis and Machine Intelligence, Vol. 3, 1981, pp. 611–614.
L. Miclet and M. Dabouz, “Approximative fast nearest-neighbor recognition,” Pattern Recognition Letters, Vol. 1, 1983, pp. 277–285.
R.S. Michalski and R.E. Stepp III, “Automated construction of classification: Conceptual clustering versus numerical taxonomy,” IEEE Trans. Pattern Analysis and Machine Intelligence, Vol. 5, 1983, pp. 396–410.
S.D. Morgera, “Linear, structured covariance estimation: An application to pattern classification for remote sensing,” Pattern Recognition Letters, Vol. 4, 1986, pp. 1–7.
J. K. Mui and K. S. Fu, “Automated classification of nucleated blood cells using binary tree classifier,” IEEE Trans. Pattern Analysis and Machine Intelligence, Vol. 2, 1980, pp. 429–443.
M. Nagao, “Control strategies in pattern analysis,” Pattern Recognition, Vol. 17, 1984, pp. 45–56.
G. Nagy, “Candide’s practical principles of experimental pattern recognition,” IEEE Trans, on Pattern Analysis and Machine Intelligence, Vol. 5, 1983, pp. 199–200.
N. Nandhakumar and J.K. Aggarawal, “The artificial intelligence approach to pattern recognition—a perspective and an overview,” Pattern Recognition, Vol. 18, 1985, pp. 383–389.
P. M. Narendra and K. Fukunaga, “A branch and bound algorithm for feature subset selection,” IEEE Trans. Computers, Vol. 26, 1977, pp. 917–922.
L.M. Ni and A.K. Jain, “A VLSI systolic architecture for pattern clustering,” IEEE Trans, on Pattern Analysis and Machine Intelligence, Vol. 7, 1985, pp. 80–89.
E. Oja and M. Kuusela, “The ALSM algorithm—An improved subspace method for classification,” Pattern Recognition, Vol. 16, 1983, pp. 421–427.
T. Okada and S. Tomita, “An optimal orthonormal system for discriminant analysis,” Pattern Recognition, Vol. 18, 1985, pp. 139–144.
T. Pavlidis, Structural Pattern Recognition, Springer Verlag, 1977.
R. Peck and J. Van Ness, “The use of shrinkage estimators in linear discriminant analysis,” IEEE Trans. Pattern Analysis and Machine Intelligence, Vol. 4, 1982, pp. 530–537.
J.G. Postaire and C. Vasseur, “A fast algorithm for nonparametric probability density estimation,” IEEE Trans. Pattern Analysis and Machine Intelligence, Vol. 4, 1982, pp. 663–666.
B.D. Ripley, Spatial Statistics, Wiley, 1981.
I.K. Sethi and G.P.R. Sarvarayudu, “Hierarchical classifier design using mutual information,” IEEE Trans. Pattern Analysis and Machine Intelligence, Vol. 4,1982, pp. 441–445.
A.R. Smith and L.D. Erman, “Noah—A bottom-up word hypothesizer for largevocabulary speech understanding systems,” IEEE Trans. Pattern Analysis and Machine Intelligence, Vol. 3, 1981, pp. 41–51.
S.P. Smith, “A window-width selection rule for kernel-based density estimation,” Technical Report, Northrop Research and Technology Center, Palos Verdes Peninsula, CA, 1986.
S.P. Smith and A.K. Jain, “An experiment on using the Friedman-Rafsky test to determine the multivariate normality of a data set,” Proceedings IEEE CVPR Conference, San Francisco, 1985, pp. 423–425.
S.P. Smith and A.K. Jain, “Testing for uniformity in multidimensional data,” IEEE Trans. Pattern Analysis and Machine Intelligence, Vol. 6, 1984, pp. 73–81.
K.J. Supowit, “Topics in computational geometry,” Ph.D. thesis, Department of Computer Science, University of Illinois, Urbana, 1981.
P. H. Swain, S.B. Vardeman and J.C. Tilton, “Contextual classification of multispectral image data,” Pattern Recognition, Vol. 13, 1981, pp. 429–441.
J.C. Tilton and J.P. Strong, “Analyzing remotely sensed data on the massively parallel processor,” Proceedings Seventh International Conference on Pattern Recognition, Montreal, 1974, pp. 398–400.
G. T. Toussaint, “The use of context in pattern recognition,” Pattern Recognition, Vol. 10, 1978, pp. 189–204.
G.T. Toussaint, “Pattern recognition and geometrical complexity,” Proceedings 5th International Conference on Pattern Recognition, Miami Beach, 1980, pp. 1324–1327.
G.V. Trunk, “A problem of dimensionality: A simple example,” IEEE Trans. Pattern Analysis and Machine Intelligence, Vol. 1, 1979, pp. 306–307.
R.B. Urquhart, “Graph theoretical clustering based on limited neighborhood sets,” Pattern Recognition, Vol. 15, 1982, pp. 173–187.
J. Van Ness, “On the dominance of non-parametric Bayes rule discriminant algorithms in high dimensions,” Pattern Recognition Journal, Vol. 12, 1980, pp. 355–368.
N. Wyse, A.K. Jain and R. Dubes, “A critical review of intrinsic dimensionality algorithms,” in Pattern Recognition in Practice, E.S. Gelsema and L.N. Kanal (eds.), North Holland, 1980, pp. 415–425.
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Jain, A.K. (1987). Advances in Statistical Pattern Recognition. In: Devijver, P.A., Kittler, J. (eds) Pattern Recognition Theory and Applications. NATO ASI Series, vol 30. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-83069-3_1
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DOI: https://doi.org/10.1007/978-3-642-83069-3_1
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