Interactive Reliability Assessment Using an Integrated Reliability Data Bank

  • R. N. Allan
  • A. M. Whitehead
Conference paper


Predicting system reliability requires two main inputs. One is an adequate reliability model that responds to the actual parameters which affect system behaviour, its modes of failure and the consequences of failure. Many texts describe such models and their application, for example, References [1,2,3]. The other is numerical reliability data that realistically represents component behaviour. One such of data is MIL-HDBK 217D [4]. In order to adequately assess system reliability and to incorporate such analyses in system desiqn, it is essential to perform sensitivity studies. These should vary, not only the numerical data but also the system characteristics, system structure and system desiqn. Such studies can qreatly enhance the quality of desiqn. For practical systems, these are more efficiently performed usinq interactive computational techniques which would be more efficient if the reliability prediction program is coupled directly to a relevant source of data to create an integrated reliability assessment/reliability data bank system. This paper describes the loqical structure, techniques and practical application of such a computer-aided technique based on a microcomputer usinq floppy disc Random Access Files.


Failure Rate Environment Category Microelectronic Component Circuit Data Failure Rate Model 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.


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  1. 1.
    R Billinton and R N Allan, “Reliability Evaluation of Engineering Systems: Concepts and Techniques”, Pitman Books Ltd, London, 1983.MATHGoogle Scholar
  2. 2.
    J E Arsenault and J A Roberts (Editors), “Reliability and Maintainability of Electronic Systems”, Pitman Books, 1980.Google Scholar
  3. 3.
    P D T O’Connor, “Practical Reliability Engineering”, Wiley, 1985.Google Scholar
  4. 4.
    US MIL-HDBK 217D, “Reliability Prediction of Electronic Systems”, January 1982 plus Notice 1, June 1983.Google Scholar

Copyright information

© Springer-Verlag Berlin, Heidelberg 1986

Authors and Affiliations

  • R. N. Allan
    • 1
  • A. M. Whitehead
    • 1
  1. 1.Dept of Electrical EngineeringUMISTManchesterEngland

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