Abstract
A wide variety of diffraction, spectroscopy, and microscopy techniques are now available for the characterisation of surfaces, but only the microscopical methods, primarily using electrons, are able to provide direct real-space information about local inhomogeneities such as surface steps, terraces, domains, and defects. As a consequence of technical improvements, high-resolution electron microscopes in particular are nowadays capable of atomic imaging, and electron microscopists are already starting to utilise this capability in their studies of surfaces. Subnanometer surface detail can be resolved in the reflection imaging mode and atomic-scale features are visible in the transmission and profile imaging modes. The results already available indicate that these high-resolution electron microscopy (HREM) techniques should be indispensable to obtaining a detailed understanding of many surfaces and their macroscopic properties.
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Smith, D.J. (1986). High-Resolution Electron Microscopy in Surface Science. In: Vanselow, R., Howe, R. (eds) Chemistry and Physics of Solid Surfaces VI. Springer Series in Surface Sciences, vol 5. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-82727-3_15
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DOI: https://doi.org/10.1007/978-3-642-82727-3_15
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