Scanning Tunneling Microscopy

  • R. J. Behm
  • W. Hösler
Part of the Springer Series in Surface Sciences book series (SSSUR, volume 5)


The scanning tunneling microscope (STM)-developed by Binnig and Rohrer-has recently appeared as a new instrument for surface structure investigations with atomic resolution. This chapter is intended to give a general overview of the current status of the STM and to illustrate its potential and performance with typical examples, supplemented by an updated listing of previous STM work. It is subdivided into the following parts: First we provide a short general introduction to scanning tunneling microscopy, then we list the experimental problems, give an overview of the different instrumental concepts, and discuss some typical problems of STM measurements related to the instrument. The next section is concerned with the current understanding and modeling of the correlation between the tunnel current and the shape and size of the tunnel barrier, which also includes the question of the resolution of the STM. The following section then deals with different applications and examples of surface microscopy. It also contains a brief look at other applications of the STM. In the fifth section we focus on spectroscopic data, i.e., results on the electronic structure of the surface. The conclusions in the last section summarize these features and give a brief perspective of some future uses of the STM.


Barrier Height Scanning Tunneling Microscope Tunnel Current Scanning Tunneling Microscope Image Tunnel Barrier 
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  1. 14.1
    G. Binnig, H. Rohrer, Ch. Gerber, E. Weibel: Physica (Utrecht) 107B+C, 1335 (1981)Google Scholar
  2. 14.2
    G. Binnig, H. Rohrer, Ch. Gerber, E. Weibel: Appl. Phys. Lett. 40, 178 (1982)Google Scholar
  3. 14.3
    G. Binnig, H. Rohrer, Ch. Gerber, E. Weibel: Phys. Rev. Lett. 49, 57 (1982)Google Scholar
  4. 14.4
    G. Binnig, H. Rohrer: Helv. Phys. Acta 55, 726 (1983)Google Scholar
  5. 14.5
    G. Binnig, H. Rohrer: Phys. B1. 39, 16,176 (1983)Google Scholar
  6. 14.6
    G. Binnig, H. Rohrer: Surf. Sci. 126, 236 (1983)Google Scholar
  7. 14.7
    G. Binnig, H. Rohrer: Surf. Sci. 152/153, 17 (1985)Google Scholar
  8. 14.8
    M.D. Pashley, J.B. Pethica, J. Coombs: Surf. Sci. 152/153, 27 (1985)Google Scholar
  9. 14.9
    R.F. Willis, M.C. Payne, J.B. Pethica, M.D. Pashley, J.H. Coombs: In Festkdrperprobleme XXV, ed. by P. Grosse (Vieweg, Braunschweig 1985)Google Scholar
  10. 14.10
    E. Stoll: In conference handouts of 26. Cours de Perfectionnement de l’Association Vaudoise des Chercheurs en Physiques, “Physique des Surfaces”, Saas Fee, Switzerland 1984, ed. by E. Bornand, A. Chapelain, P. Millet, pp.87–156Google Scholar
  11. 14.11
    G. Binnig, H. Rohrer: Sci. Am. 253, 40 (1985)Google Scholar
  12. 14.12
    G. Binnig, H. Rohrer, Chr. Gerber, H. Fuchs, E. Stoll, E. Tosatti: To be publishedGoogle Scholar
  13. 14.13
    J.R. Oppenheimer: Phys. Rev. 31, 66 (1928)Google Scholar
  14. 14.14
    R.H. Fowler, L. Nordheim: Proc. R. Soc. London, Ser. A119, 173 (1928)Google Scholar
  15. 14.15
    J. Frenkel: Phys. Rev. 36, 1104 (1930)Google Scholar
  16. 14.16
    W. Thompson, S.F. Hanrahan: Rev. Sci. Instrum. 47, 1303 (1976)Google Scholar
  17. 14.17
    U. Poppe: Physica 108B, 805 (1981)Google Scholar
  18. 14.17
    U. Poppe, H. Schröder: In Proc. 17th Int. Conf. Low Temp. Phys., Karlsruhe 1984, ed. by U. Eckern, A. Schmid, W. Weber, H. Wühl (Elsevier, Amsterdam 1984) p.835Google Scholar
  19. 14.17
    U. Poppe: J. Magn. & Magn. Mater. 52, 157 (1985)Google Scholar
  20. 14.18
    R.D. Young: Rev. Sci. Instrum. 37, 275 (1966)Google Scholar
  21. 14.18
    R.D. Young, J. Ward, F. Scire: Phys. Rev. Lett. 27, 922 (1971)Google Scholar
  22. 14.19
    C. Teague: Ph.D. Thesis, North Texas State University, Denton (1978)Google Scholar
  23. 14.19
    C. Teague: Bull. Am. Phys. Soc. 23, 230 (1978)Google Scholar
  24. 14.20
    R.D. Young: Private communicationGoogle Scholar
  25. 14.21
    E. Burstein, S. Lundquist (eds.): Inelastic Phenomena in Solids (Plenum, New York 1969)Google Scholar
  26. 14.21
    T. Wolfram (ed.): Inelastic Electron Tunneling Spectroscopy, Springer Ser. Solid-State-Sci., Vol.4 (Springer, Berlin, Heidelberg 1978)Google Scholar
  27. 14.21
    E.L. Wolf: Rep. Prog. Phys. 41, 1439 (1978)Google Scholar
  28. 14.21
    E.L. Wolf: Principles of Electron Tunneling Spectroscopy (Oxford U. Press, Oxford 1985)Google Scholar
  29. 14.21
    P. Hansma (ed.): Tunneling Spectroscopy (Plenum, New York 1982)Google Scholar
  30. 14.22
    J.W. Gadzuk, E.W. Plummer: Rev. Mod. Phys. 45, 487 (1973)Google Scholar
  31. 14.23
    C.B. Duke: In Tunneling in Solids, Solid State Physics, Vol.10, ed. by F. Seitz, D. Turnbull, H. Ehrenreich (Academic, New York 1969)Google Scholar
  32. 14.24
    E.W. Muller: Phys. Z. 37, 838 (1936); Z. Phys. 106, 541 (1937)Google Scholar
  33. 14.24
    E. W. Müller, T.T. Tsong: Field Ion Microscopy (Elsevier, New York 1969)Google Scholar
  34. 14.25
    G. Ehrlich: In Chemistry and Physics of Solid Surfaces V, ed. by R. Vanselow, R. Howe, Springer Ser. Chem. Phys., Vol.35 (Springer, Berlin, Heidelberg 1984)Google Scholar
  35. 14.26
    Chr. Gerber: IBM J. Res. Dev., in pressGoogle Scholar
  36. 14.27
    S. Elrod, A.L. de Lozanne, C.F. Quate: Appl. Phys. Lett. 45, 1240 (1984)Google Scholar
  37. 14.28
    A.L. de Lozanne, S.A. Elrod, C.F. Quate: Phys. Rev. Lett. 54, 2433 (1985)Google Scholar
  38. 14.29
    S.A. Elrod: IBM J. Res. Dev., in pressGoogle Scholar
  39. 14.30
    R.V. Coleman, B. Drake, P.K. Hansma, G. Slough: Phys. Rev. Lett. 55, 394 (1985)Google Scholar
  40. 14.31
    S. Chiang, R.J. Wilson: IBM J. Res. Dev., in pressGoogle Scholar
  41. 14.32
    W. Hösier, R.J. Behm: Unpublished resultsGoogle Scholar
  42. 14.33
    W.J. Kaiser, R.C. Jaklevic: IBM J. Res. Dev., in pressGoogle Scholar
  43. 14.34
    W.J. Kaiser, R.C. Jaklevic: Bull. Am. Phys. Soc. 30, 309 (1985)Google Scholar
  44. 14.35
    M. Ringger, H. Hidber, R. Schlögl, P. Oelhafen, H.J. Güntherodt, K. Wandelt, G. Ertl: In Proc. 17th Int. Conf. Low Temp. Phys., Karlsruhe 1984, ed. by U. Eckern, A. Schmid, W. Weber, H. Wühl (Elsevier, Amsterdam 1984)Google Scholar
  45. 14.36
    M. Ringger, H.R. Hidber, R. Schlögl, P. Oelhafen, H.J. Güntherodt, K. Wandelt, G. Ertl: In The Structure of Surfaces, ed. by M.A. Van Hove, S.Y. Tong, Springer Ser. Surf. Sci., Vol.2 (Springer, Berlin Heidelberg 1985) p.48Google Scholar
  46. 14.37
    M. Ringger, H.J. Güntherodt, B.W. Corb, H.R. Hidber, P. Oelhafen, R. Schlögl, A. Stemmer, R. Wiesendanger: IBM J. Res. Dev., in pressGoogle Scholar
  47. 14.38
    J.E. Demuth, R.J. Hamers, R.M. Tromp, M.E. Welland: IBM J. Res. Dev., in pressGoogle Scholar
  48. 14.39
    P.K. Hansma: IBM J. Res. Dev., in pressGoogle Scholar
  49. 14.40
    J. Moreland, S. Alexander, M. Cox, R. Sonnenfeld, P.K. Hansma: Appl. Phys. Lett. 43, 387 (1983)Google Scholar
  50. 14.41
    J. Moreland, P.K. Hansma: Rev. Sci. Instrum. 55, 399 (1984)Google Scholar
  51. 14.42
    J. Moreland, J. Drucker, P.K. Hansma, J.P. Katthaus, A. Adams, R. Kvaas: Appl. Phys. Lett. 45, 104 (1984)Google Scholar
  52. 14.43
    S. Vieira: IBM J. Res. Dev., in pressGoogle Scholar
  53. 14.44
    U. Tietze, Ch. Schenk: Halbleiter-Schaltungstechnik, 7. Aufl. (Springer, Berlin, Heidelberg 1985)Google Scholar
  54. 14.45
    D. Pohl: IBM J. Res. Dev., in pressGoogle Scholar
  55. 14.46
    G.F.A. van de Walle, J.W. Gerritsen, H. van Kempen, P. Wyder: Rev. Sci. Instrum. 56, 1573 (1985)Google Scholar
  56. 14.47
    H. van Kempen: IBM J. Res. Dev., in pressGoogle Scholar
  57. 14.48
    R.M. Feenstra, W.A. Thompson, A.P. Fein: Phys. Rev. Lett., in pressGoogle Scholar
  58. 14.49
    S. Chiang, R.J. Wilson: Private communicationGoogle Scholar
  59. 14.50
    H.W. Fink: IBM J. Res. Dev., in pressGoogle Scholar
  60. 14.51
    Y. Kuk: Private communicationGoogle Scholar
  61. 14.52
    H.W. Fink: Private communicationGoogle Scholar
  62. 14.53
    J.G. Simmons: J. Appl. Phys. 34, 1793 (1963). The effect of the image potential was overestimated by a factor of two in this work [14.23]Google Scholar
  63. 14.54
    J. Bardeen: Phys. Rev. Lett. 6, 57 (1961)Google Scholar
  64. 14.55
    G. Binnig, N. Garcia, H. Rohrer, J.M. Soler, F. Flores: Phys. Rev. B30, 4816 (1984)Google Scholar
  65. 14.56
    T.E. Feuchtwang, P.H. Cutler, N.M. Miskowsky, A.A. Lucas: In Quantum Metrology and Fundamental Physical Constants, ed. by P.H. Cutler, A.A. Lucas, NATO ASI Series B, Vol.3 (Plenum, New York 1983) p.529Google Scholar
  66. 14.57
    J. Tersoff, D.R. Hamann: Phys. Rev. Lett. 50, 1998 (1983)Google Scholar
  67. 14.58
    J. Tersoff, D.R. Hamann: Phys. Rev. B31, 805 (1985)Google Scholar
  68. 14.59
    T.E. Feuchtwang, P.H. Cutler, N.H. Miskovsky: Phys. Lett. 99A, 167 (1983)Google Scholar
  69. 14.60
    N. Garcia, C. Ocal, F. Flores: Phys. Rev. Lett. 50, 2002 (1983)Google Scholar
  70. 14.61
    E. Stoll, A. Baratoff, A. Selloni, P. Carnevali: J. Phys. C17, 3073 (1984)Google Scholar
  71. 14.62
    E. Stoll: Surf. Sci. 143, L411 (1984)Google Scholar
  72. 14.63
    N. Garcia, F. Flores: Physica 127B, 137 (1984)Google Scholar
  73. 14.64
    A. Baratoff: Physica 127B, 143 (1984)Google Scholar
  74. 14.65
    N. Garcia: J. Chem. Phys. 67, 897 (1977)Google Scholar
  75. 14.66
    N. Garcia, N. Cabrera: Phys. Rev. B18, 576 (1978)Google Scholar
  76. 14.67
    N. Garcia, J. Barker, I.P. Batra: J. Electron. Spectrosc. Relat. Phenom. 30, 137 (1983)Google Scholar
  77. 14.68
    N. Esbjerg, J.K. Nørskov: Phys. Rev. Lett. 45, 807 (1980)Google Scholar
  78. 14.69
    M.C. Paynes, J.C. Inkson: Surf. Sci. 159, 485 (1985)Google Scholar
  79. 14.70
    T.E. Feuchtwang, P.H. Cutler, E. Kazer: J. Phys. (Paris) C9, 111 (1985)Google Scholar
  80. 14.71
    A.A. Lucas, J.P. Vigneron, J. Bono, P.H. Lütler, T.E. Feuchtwang, R.H. Good, Jr., Z. Huang: J. Phys. (Paris) C9, 125 (1985)Google Scholar
  81. 14.72
    J. Bono, R.H. Good, Jr.: Surf. Sci. 151, 543 (1985)Google Scholar
  82. 14.73
    M. Büttiker, R. Landauer: Phys. Rev. Lett. 49, 1739 (1982)Google Scholar
  83. 14.73
    M. Büttiker: Phys. Rev. B27, 6178 (1983)Google Scholar
  84. 14.74
    M. Büttiker: IBM J. Res. Dev., in pressGoogle Scholar
  85. 14.75
    Z.A. Weinberg, A. Hartstein: Solid State Commun. 20, 179 (1976)Google Scholar
  86. 14.76
    N.D. Lang, W. Kohn: Phys. Rev. B3, 1215 (1971)Google Scholar
  87. 14.77
    O.C. Wells: Scanning Electron Microscope (McGraw-Hill, New York 1974)Google Scholar
  88. 14.78
    G. Binnig, H. Rohrer, Ch. Gerber, E. Weibel: Phys. Rev. Lett. 50, 120 (1983)Google Scholar
  89. 14.79
    G. Binnig, H. Rohrer, F. Salvan, Ch. Gerber, A. Baró: Surf. Sci. 157, L373 (1985)Google Scholar
  90. 14.80
    G. Binnig, H. Rohrer, Chr. Gerber, E. Weibel: Surf. Sci. 131, L 379 (1983)Google Scholar
  91. 14.81
    J.K. Gimzewski, A. Humbert, J.G. Bednorz, B. Reihl: Phys. Rev. Lett. 55, 951 (1985)Google Scholar
  92. 14.82
    A. Humbert: IBM J. Res. Dev., in pressGoogle Scholar
  93. 14.83
    R. Miranda: Private communicationGoogle Scholar
  94. 14.84
    F. Flores, N. Garcia: Phys. Rev. B30, 2289 (1984)Google Scholar
  95. 14.85
    T.E. Hartmann: J. Appl. Phys. 33, 3427 (1962)Google Scholar
  96. 14.86
    N.D. Lang: Phys. Rev. Lett. 55, 230 (1985)Google Scholar
  97. 14.87
    N.D. Lang: IBM J. Res. Dev., in pressGoogle Scholar
  98. 14.88
    R.J. Behm, W. Hosier, E. Ritter: To be publishedGoogle Scholar
  99. 14.89
    M. Ringger, H. Hidber, R. Schlögl, P. Oelhafen, H.J. Güntherodt: Appl. Phys. Lett. 46, 832 (1984)Google Scholar
  100. 14.90
    P.A.M. Benistant, G.F.A. van de Walle, H. van Kempen, P. Wyder: To be publishedGoogle Scholar
  101. 14.91
    G.K. Binnig, H. Rohrer, Chr. Gerber, E. Stoll: Surf. Sci. 144, 321 (1984)Google Scholar
  102. 14.92
    R.J. Behm, W. Hosier, E. Ritter, G. Binnig: J. Vac. Sci. Technol., in pressGoogle Scholar
  103. 14.93
    R.J. Behm, W. Hösier, E. Ritter, G. Binnig: Phys. Rev. Lett., in pressGoogle Scholar
  104. 14.94
    A.M. Baró, G. Binnig, H. Rohrer, Chr. Gerber, E. Stoll, A. Baratoff, F. Salvan: Phys. Rev. Lett. 52, 1304 (1985)Google Scholar
  105. 14.95
    R.M. Feenstra: IBM J. Res. Dev., in pressGoogle Scholar
  106. 14.96
    R.M. Tromp, R.J. Hamers, J.E. Demuth: Phys. Rev. Lett. 55, 1303 (1985)Google Scholar
  107. 14.97
    R.M. Feenstra, A.P. Fein: Phys. Rev. B32, 1394 (1985)Google Scholar
  108. 14.98
    R.S. Becker, J.A. Golovchenko, B.S. Swartzentruber: Phys. Rev. Lett. 54, 2678 (1985)Google Scholar
  109. 14.99
    See, e.g., P. Heilmann, K. Heinz, K. Müller: Surf. Sci. 83, 487 (1979)Google Scholar
  110. 14.100
    D.G. Fedak, N.A. Gjostein: Surf. Sci. 8, 77 (1967)Google Scholar
  111. 14.101
    W. Moritz: Habilitationsschrift, Universität München (1984)Google Scholar
  112. 14.102
    W. Moritz, D. Wolf: Surf. Sci. 163, L655 (1985)Google Scholar
  113. 14.103
    H.P. Bonzel, S. Ferrer: Surf. Sci. 118, L263 (1982)Google Scholar
  114. 14.103
    S. Ferrer, H.P. Bonzel: Surf. Sci. 119, 234 (1982)Google Scholar
  115. 14.104
    I.K. Robinson: Phys. Rev. Lett. 50, 1145 (1983)Google Scholar
  116. 14.104
    I. K. Robinson, Y. Kuk, L.C. Feldman: Phys. Rev. B29, 4762 (1984)Google Scholar
  117. 14.105
    H. Jagodzinski, W. Moritz, D. Wolf: Surf. Sci. 77, 233 (1978)Google Scholar
  118. 14.105
    J.C. Campuzano, M.S. Forster, G. Jennings, R.F. Willis, W. Unertl: Phys. Rev. Lett. 54, 2684 (1985)Google Scholar
  119. 14.106
    R.M. Tromp, E.J. van Loenen: Surf. Sci. 155, 441 (1985)Google Scholar
  120. 14.106
    R.M. Tromp: Surf. Sci. 155, 432 (1985)Google Scholar
  121. 14.107
    K. Takyanagi, Y. Tanishiro, M. Takahashi: J. Vac. Sci. Technol. A3, 1502 (1985)Google Scholar
  122. 14.108
    D.J. Chadi: Phys. Rev. B30, 4470 (1984)Google Scholar
  123. 14.109
    L.C. Snyder: Surf. Sci. 140, 101 (1984)Google Scholar
  124. 14.110
    E.C. McRae, P.M. Petroff: Surf. Sci. 147, 385 (1984), and references thereinGoogle Scholar
  125. 14.111
    E. Stoll: IBM J. Res. Dev., in pressGoogle Scholar
  126. 14.112
    J.A. Stroscio, W.H. Ho: Phys. Rev. Lett. 54, 1573 (1985)Google Scholar
  127. 14.113
    M.K. Debe, D.A. King: Surf. Sci. 81, 193 (1979)Google Scholar
  128. 14.114
    J.F. Wendelken, G.C. Wang: J. Vac. Sci. Technol. A3, 1593 (1985)Google Scholar
  129. 14.115
    R.F. Willis: In Proc. Many Body Phenomena at Surfaces, ed. by D.C. Langreth, D. Newns, H. Suhl (Academic, New York 1984)Google Scholar
  130. 14.116
    R.M. Feenstra, G.S. Oehrlein: Appl. Phys. Lett. 47, 1136 (1985); J. Vac. Sci. Technol. B3, 1136 (1985)Google Scholar
  131. 14.117
    W. Hosier, R.J. Behm, E. Ritter: IBM J. Res. Dev., in pressGoogle Scholar
  132. 14.118
    G. Comsa, G. Mechtersheimer, B. Poelsema: Surf. Sci. 119, 159 (1982)Google Scholar
  133. 14.119
    W. Hosier, E. Ritter, R.J. Behm: Ber. Bunsenges. Phys. Chem., in pressGoogle Scholar
  134. 14.120
    See, e.g., S.M. Davis, G.A. Somorjai: In The Chemical Physics of Solid Surfaces and Heterogeneous Catalysis, ed. by D.A. King, D.P. Woodruff (Elsevier, Amsterdam 1982)Google Scholar
  135. 14.121
    A.E. Morgan, G.A. Somorjai: J. Chem. Phys. 51, 3309 (1969)Google Scholar
  136. 14.122
    K. Baron, D.W. Blakely, G.A. Somorjai: Surf. Sci. 41, 157 (1974)Google Scholar
  137. 14.123
    A.M. Baro, R. Miranda, J. Alaman, N. Garcia, G. Binnig, H. Rohrer, Ch. Gerber, J.L. Carrascosa: Nature (London) 315, 253 (1985)Google Scholar
  138. 14.124
    A.M. Baró, R. Miranda: IBM J. Res. Dev., in pressGoogle Scholar
  139. 14.125
    A. Humbert, J.K. Gimzewski, B. Reihl: Phys. Rev. B32, 4252 (1985)Google Scholar
  140. 14.126
    H. Raether: Surf. Sci. 140, 31 (1984)Google Scholar
  141. 14.127
    H.J. Scheel, G. Binnig, H. Rohrer: J. Cryst. Growth 60, 199 (1982)Google Scholar
  142. 14.128
    J.K. Gimzewski, A. Humbert, D.W. Pohl, S. Veprek: Surf. Sci., in pressGoogle Scholar
  143. 14.129
    R. Miranda, N. Garcia, A.M. Baro, R. Garcia, J.L. Pena, H. Rohrer: Appl. Phys. Lett. 47, 367 (1985)Google Scholar
  144. 14.130
    N. Garcia, A.M. Baró, R. Miranda, H. Rohrer, Ch. Gerber, R. Garcia Cantu, J.L. Pena: Metrologia 21, 135 (1985)Google Scholar
  145. 14.131
    U. Durig, D.W. Pohl, F. Rohner: IBM J. Res. Dev., in press; and to be publishedGoogle Scholar
  146. 14.132
    P. Muralt, D.W. Pohl, W. Denk: IBM J. Res. Dev., in press P. Muralt, D.W. Pohl: To be publishedGoogle Scholar
  147. 14.133
    H.H. Farell, D.M. Levinson: Phys. Rev. B31, 3593 (1985)Google Scholar
  148. 14.134
    G. Binnig, H. Fuchs, E. Stoll: To be publishedGoogle Scholar
  149. 14.135
    R. Gomer: IBM J. Res. Dev., in pressGoogle Scholar
  150. 14.136
    R. Gomer: To be publishedGoogle Scholar
  151. 14.137
    F.J. Himpsel, D.E. Eastman: Phys. Rev. B18, 5236 (1978)Google Scholar
  152. 14.137
    N.E. Christensen: Phys. Rev. B14, 3446 (1976)Google Scholar
  153. 14.138
    J.E. Demuth: Surf. Sci. 65, 369 (1977)Google Scholar
  154. 14.139
    G. Binnig, H. Fuchs, J. Kübler, F. Salvan, A.R. Williams: To be publishedGoogle Scholar
  155. 14.140
    N.F. Mott: Metal Insulator Transitions (Taylor and Francis, London 1974)Google Scholar
  156. 14.141
    R. Garcia, J.J. Saenz, N. Garcia: To be publishedGoogle Scholar
  157. 14.142
    R.C. Jaklevic: Phys. Rev. 165, 821 (1965)Google Scholar
  158. 14.143
    R.S. Becker, J.A. Golovchenko, B.S. Swartzentruber: Phys. Rev. Lett. 55, 987 (1985)Google Scholar
  159. 14.144
    G. Binnig, K.H. Frank, H. Fuchs, N. Garcia, B. Reihl, H. Rohrer, F. Salvan, A.R. Williams: Phys. Rev. Lett. 55, 991 (1985)Google Scholar
  160. 14.145
    F. Salvan, H. Fuchs, A. Baratoff, G. Binnig: Surf. Sci., in pressGoogle Scholar
  161. 14.146
    K.H. Gundlach: Solid-State Electron. 9, 949 (1966)Google Scholar
  162. 14.147
    M.E. AIferieff, C.B. Duke: J. Chem. Phys. 46, 938 (1967)Google Scholar
  163. 14.148
    J. Maserijan, N. Zamani: J. Appl. Phys. 53, 559 (1982)Google Scholar
  164. 14.149
    T.W. Hickmott, P.M. Solomon, R. Fischer, H. Morkorc: Appl. Phys. Lett. 44, 90 (1984)Google Scholar
  165. 14.150
    See, e.g., V. Dose, W. Altmann, A. Goldmann, U. Kolac, J. Rogozig: Phys. Rev. Lett. 52, 1919 (1984)Google Scholar
  166. 14.150
    N. Garcia, B. Reihl, K.H. Frank, A.R. Williams: Phys. Rev. Lett. 54, 591 (1985)Google Scholar
  167. 14.151
    K. Giesen, F. Hage, F.J. Himpsel, H.J. Riess, W. Steinmann: Phys. Rev. Lett. 55, 300 (1985)Google Scholar
  168. 14.152
    P.D. Johnson, N.V. Smith: Phys. Rev. B27, 2577 (1983)Google Scholar
  169. 14.153
    H. Eckardt, L. Fritsche, J. Noffke: J. Phys. F14, 97 (1984)Google Scholar
  170. 14.154
    D.F. Woodruff, N.V. Smith, P.D. Johnson, W.D. Royer: Phys. Rev. B26, 2943 (1982)Google Scholar
  171. 14.155
    G. Binnig, H. Fuchs, F. Salvan: Verh. Dtsch. Phys. Ges. (VI) 20, 898 (1985)Google Scholar
  172. 14.156
    N.J. Doran, A.M. Woolley: J. Phys. C14, 4257 (1981)Google Scholar
  173. 14.157
    J.H. Coombs, J.B. Pethica: IBM J. Res. Dev., in pressGoogle Scholar
  174. 14.158
    R. Smoluchowski: Phys. Rev. 60, 661 (1941)Google Scholar
  175. 14.159
    K. Wandelt: J. Vac. Sci. Technol. A2, 802 (1984)Google Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 1986

Authors and Affiliations

  • R. J. Behm
    • 1
  • W. Hösler
    • 2
  1. 1.Institut für Physikalische ChemieUniversität MünchenMünchen 2Germany
  2. 2.Institut für KristallographieUniversität MünchenMünchen 2Germany

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