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Scanning Tunneling Microscopy

  • R. J. Behm
  • W. Hösler
Part of the Springer Series in Surface Sciences book series (SSSUR, volume 5)

Abstract

The scanning tunneling microscope (STM)-developed by Binnig and Rohrer-has recently appeared as a new instrument for surface structure investigations with atomic resolution. This chapter is intended to give a general overview of the current status of the STM and to illustrate its potential and performance with typical examples, supplemented by an updated listing of previous STM work. It is subdivided into the following parts: First we provide a short general introduction to scanning tunneling microscopy, then we list the experimental problems, give an overview of the different instrumental concepts, and discuss some typical problems of STM measurements related to the instrument. The next section is concerned with the current understanding and modeling of the correlation between the tunnel current and the shape and size of the tunnel barrier, which also includes the question of the resolution of the STM. The following section then deals with different applications and examples of surface microscopy. It also contains a brief look at other applications of the STM. In the fifth section we focus on spectroscopic data, i.e., results on the electronic structure of the surface. The conclusions in the last section summarize these features and give a brief perspective of some future uses of the STM.

Keywords

Barrier Height Scanning Tunneling Microscope Tunnel Current Scanning Tunneling Microscope Image Tunnel Barrier 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag Berlin Heidelberg 1986

Authors and Affiliations

  • R. J. Behm
    • 1
  • W. Hösler
    • 2
  1. 1.Institut für Physikalische ChemieUniversität MünchenMünchen 2Germany
  2. 2.Institut für KristallographieUniversität MünchenMünchen 2Germany

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