SIMS Depth Profiling of Si in GaAs
The controllable doping of GaAs layers by silicon, either by ion implantation or by incorporation during molecular beam epitaxial growth, is a critical step in III–V device fabrication. We have therefore undertaken a study to determine the optimum experimental conditions for SIMS depth profiling Si in GaAs, for Si+ implanted into GaAs, and for thin, abrupt GaAs/A1GaAs MBE layers doped with Si.
KeywordsPrimary Beam GaAs Layer High Mass Resolution Spectrum Controllable Doping GaAs Wafer
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