Silicon-Induced Enhancement of Secondary Ion Emission in Silicates: A Study of the Matrix Effects

Abstract

One of the elusive goals in application of SIMS techniques to geochemistry and cosmochemistry is to devise a procedure by which secondary ion intensities can be quantitatively converted to concentrations. Although an empirical “working curve” approach has been successful for trace elements (see, for instance, RAY and HART[1]), quantitative analysis of the major elements has been difficult due mainly to the complex relationships between secondary ion intensity and concentration known as matrix effects. The matrix effects occur among different mineral groups (qualitatively similar to the “SIMS matrix effect” of DELINE et al. [2]) and even within a given mineral group as chemical composition of the solid solution varies (e.g., SHIMIZU et al. [3]). A better understanding of the matrix effects is imperative in establishing a quantitation procedure for geologic materials as most minerals form complex and extensive solid solutions, and is also essential, in more general terms, in understanding the physics of the secondary ion emission process.