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Measurements of the SIMS Isotope Effect

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Secondary Ion Mass Spectrometry SIMS V

Part of the book series: Springer Series in Chemical Physics ((CHEMICAL,volume 44))

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Abstract

Several models of ion emission predict that the heavier isotopes of a given element will be under-represented in the SIMS mass spectrum. Isotope effect measurements by the Orsay group [1,2] and by SHIMIZU and HART [3] have demonstrated this behavior. The present study supplements this work with additional velocity- dependent measurements of the isotope effect in various materials. Negative ion emission and dimer formation are also investigated. Several interesting experimental observations are reported here.

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References

  1. J.C. Lorin, A. Havette, and G. Slodzian, in Secondary Ion Mass Spectrometry–SIMS III, A. Benninghoven et al., eds. (Springer- Verlag, Berlin 1982), pp. 140–150

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  2. G. Slodzian, ibid., pp.115–123

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  3. N. Shimizu and S.R. Hart, J. Appl. Phys. 53, 1303 (1982)

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  4. F.W. Walker, G.J. Kirouac, and F.M. Rourke, “Chart of the Nuclides,” (General Electric Co. 1977)

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  5. A.J. Fahey, K.D. McKeegan, and E.K. Zinner, these proceedings

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© 1986 Springer-Verlag Berlin Heidelberg

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Schwarz, S.A. (1986). Measurements of the SIMS Isotope Effect. In: Benninghoven, A., Colton, R.J., Simons, D.S., Werner, H.W. (eds) Secondary Ion Mass Spectrometry SIMS V. Springer Series in Chemical Physics, vol 44. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-82724-2_6

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  • DOI: https://doi.org/10.1007/978-3-642-82724-2_6

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-82726-6

  • Online ISBN: 978-3-642-82724-2

  • eBook Packages: Springer Book Archive

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