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Application of SIMS Technique to Industrially Used Organic Materials

  • S. Tomita
  • K. Okuno
  • F. Soeda
  • A. Ishitani
Part of the Springer Series in Chemical Physics book series (CHEMICAL, volume 44)

Abstract

We reported in the SIMS IV conference establishment of a measurement condition for the analysis of low concentration elements within an organic polymer matrix [1]. Prevention of charge-up by gold coating, dynamic SIMS conditions with O2+ and Cs+ primary ions to suppress molecular ions background and also to attain sensitivity and good depth resolution, were undertaken.

Keywords

Carbon Fiber Depth Profile Printing Plate Organic Polymer Matrix Single Carbon Fiber 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Reference

  1. 1.
    K. Okuno, S. Tonvita and A. Ishitani: Proceeding 4th SIMS Conference, Osaka 392 (1984) Springer Verlag Ed.Google Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 1986

Authors and Affiliations

  • S. Tomita
    • 1
  • K. Okuno
    • 1
  • F. Soeda
    • 1
  • A. Ishitani
    • 1
  1. 1.Toray Research CenterInc.Sonoyama, Otsu, Shiga 520Japan

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