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Time-of-Flight Investigations of Secondary Ion Emission from Metal Halides

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Secondary Ion Mass Spectrometry SIMS V

Part of the book series: Springer Series in Chemical Physics ((CHEMICAL,volume 44))

Abstract

The bombardment of metal halides (MX) by keV — primary particles causes the emission of secondary atomic (M+, X-) and cluster [(MX)nM+; (MX)nX-; n = 1,2,...) ions. Once the secondary cluster ions leave the primary interaction region, they can undergo metastable decays due to the vibrational energy stored in the cluster bond during the initial production process. A large fraction of secondary cluster ions from metal halides, as well as molecular ions from organic materials, has indeed been observed to be metastable. We have studied the metastable decays of some CsI clusters and determined the corresponding rate constants.

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References

  1. K.G. Standing et.al., Int. J. Mass Spectrom. Ion Phys. 53, 125 (1983)

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  2. W. Ens et.al., submitted to Nucl. Instr. and Methods

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  3. M.A. Baldwin et.al., Int. J. Mass Spectrom. Ion Proc. 54, 97 (1983)

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Author information

Author notes

  1. G. Bolbach

    Present address: Institut Curie, 11 rue Pierre et Marie Curie, 75231, Paris, Cedex 05, France

Authors and Affiliations

  1. Physics Department, University of Manitoba, Winnipeg, Manitoba, R3T 2N2, Canada

    B. Schueler, R. Beavis, G. Bolbach, W. Ens, D. E. Main & K. G. Standing

Authors
  1. B. Schueler
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  2. R. Beavis
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  3. G. Bolbach
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  4. W. Ens
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  5. D. E. Main
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  6. K. G. Standing
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Editor information

Editors and Affiliations

  1. Physikalisches Institut, Universität Münster, Domagkstraße 75, D-4400, Münster, Fed. Rep. of Germany

    Alfred Benninghoven

  2. Chemistry Division, Naval Research Laboratory, 20375, Washington, DC, USA

    Richard J. Colton

  3. Center for Analytical Chemistry, National Bureau of Standards, 20899, Gaithersburg, MD, USA

    David S. Simons

  4. Philips Research Laboratories, NL-Eindhoven, The Netherlands

    Helmut W. Werner

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© 1986 Springer-Verlag Berlin Heidelberg

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Schueler, B., Beavis, R., Bolbach, G., Ens, W., Main, D.E., Standing, K.G. (1986). Time-of-Flight Investigations of Secondary Ion Emission from Metal Halides. In: Benninghoven, A., Colton, R.J., Simons, D.S., Werner, H.W. (eds) Secondary Ion Mass Spectrometry SIMS V. Springer Series in Chemical Physics, vol 44. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-82724-2_12

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  • DOI: https://doi.org/10.1007/978-3-642-82724-2_12

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-82726-6

  • Online ISBN: 978-3-642-82724-2

  • eBook Packages: Springer Book Archive

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