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Application of Secondary Ion Mass Spectrometry Combined with Fourier Transform Ion Cyclotron Resonance

  • S. Plesko
  • P. Grossmann
  • M. Allemann
  • H. P. Kellerhals
Part of the Springer Proceedings in Physics book series (SPPHY, volume 9)

Abstract

In past years, many new ionization techniques — e.g. secondary ion mass spectroscopy (SIMS), fast atom bombardment (FAB), field desorption (FD) or laser desorption (LD) — have been introduced for mass spectroscopic investigations of polar compounds, thermally labile molecules and salts.

Keywords

Fast Atom Bombardment Fast Atom Bombardment Mass Spectrum Incident Beam Angle Trapping Plate Broad Band Spectrum 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag Berlin Heidelberg 1986

Authors and Affiliations

  • S. Plesko
    • 1
  • P. Grossmann
    • 1
  • M. Allemann
    • 1
  • H. P. Kellerhals
    • 1
  1. 1.Spectrospin AGFällandenSwitzerland

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