Abstract
Thin films of phenylalanine evaporated onto Al foils were irradiated by MeV beams of N, Ne, S, Ar, Ca, Ni, Kr, Sn, W, Pb and U using the accelerator facilities of ALICE/Orsay and UNILAC/GSI-Darmstadt. By means of time-of-flight mass spectrometry the emission of secondary ions was investigated as function of the charge state q of the primary ion. Experiments show that the yields of ions correlated with molecular structure like (M‡ 1)± depend in addition strongly on the equilibrium charge inside the solid. These findings lead to conclusions about the time and the area of emission relative to the primary ions impact.
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References
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© 1986 Springer-Verlag Berlin Heidelberg
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Becker, O., Guthier, W., Wien, K., Della-Negra, S., le Beyec, Y., Cotter, J.R. (1986). On the Charge-State Dependence of Secondary Ion Emission from Phenylalanine. In: Benninghoven, A. (eds) Ion Formation from Organic Solids (IFOS III). Springer Proceedings in Physics, vol 9. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-82718-1_3
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DOI: https://doi.org/10.1007/978-3-642-82718-1_3
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