Abstract
Accurate measurements of secondary particle yields should provide significant insights into the mechanisms of secondary ion emission from organic liquids. Variations in primary beam energy, incident flux density, and primary particle mass, for example, are all manifested in changes in total particle yield. Ratios of secondary ion yields from two different species can be sensitive, quantitative monitors of the chemistry and kinetics respectively of ionization processes.
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© 1986 Springer-Verlag Berlin Heidelberg
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Barofsky, D.F., Barofsky, E. (1986). Sputtering Yields from Liquid Organic Matrices. In: Benninghoven, A. (eds) Ion Formation from Organic Solids (IFOS III). Springer Proceedings in Physics, vol 9. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-82718-1_17
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DOI: https://doi.org/10.1007/978-3-642-82718-1_17
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