Abstract

The semi-conductors themselves as well as the convertes and converter installations are tested according to their designed properties (electrical, thermal, etc.) [14.1, 14.2] . A distinction is made between type tests and individual tests ( routine tests) .

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References

  1. 14.1
    Harrison, R.E.; Shemie, R.K.; Krishnayya, P.C.S.: A Proposed Test Specification for HVDC Thyristors Valves. IEEE Trans. on Power Apparatus and Systems, Vol. PAS-97, No. 6 (1978) 2207–2214CrossRefGoogle Scholar
  2. 14.2
    Buri, H.; Leipold, Ph.: Anwendungsbezogene Prüfungen schneller Thyristoren. BBCNachr. Nr. 12 (1979) 459–464Google Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 1986

Authors and Affiliations

  • Klemens Heumann
    • 1
  1. 1.Institut für Allgemeine ElektrotechnikTechnische Universität BerlinBerlin 10Fed. Rep. of Germany

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