Abstract
Surface plasmon mediated light emission from rough metal films can be driven in a number of different ways. They all show characteristic features independent of the driving mechanism. The unifying feature is that each mechanism injects hot electrons into the metal. We describe surface plasmon mediated emission from tunnel junctions in terms of a hot-electron picture. We show how this emission can be used as a spectroscopic probe of hot electron dynamics in tunnel junctions. We then describe how we used this tool to probe hot electron processes in electron injector structures, leading to important new insights into electron heating in SiO2.
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Kirtley, J.R., Theis, T.N., DiMaria, D.J., Tsang, J.C., Fischetti, M.V., Brorson, S.D. (1985). Surface Plasmon Emission as a Probe of Hot-Electron Dynamics. In: Nizzoli, F., Rieder, KH., Willis, R.F. (eds) Dynamical Phenomena at Surfaces, Interfaces and Superlattices. Springer Series in Surface Sciences, vol 3. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-82535-4_27
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DOI: https://doi.org/10.1007/978-3-642-82535-4_27
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