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Electron Scattering Times in Thin Metal Films Experimental Results

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Localization, Interaction, and Transport Phenomena

Part of the book series: Springer Series in Solid-State Sciences ((SSSOL,volume 61))

Abstract

The discovery of weak-localization effects in two-dimensional metallic systems [1] has given a new impetus to the study of transport properties of disordered conductors [2]. These effects are a direct consequence of the quantum interference between diffusively-scattered electron waves. Due to this interference, the back-scattering probability for the electron is modified during the time interval 0 < t < τφ with τφ the characteristic time, after which the phase of one of the interfering electron waves is changed.

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Author information

Authors and Affiliations

  1. Laboratorium voor Vaste Stof-Fysika en Magnetisme, Katholieke Universiteit Leuven, B-3030, Leuven, Belgium

    C. Van Haesendonck, M. Gijs & Y. Bruynseraede

Authors
  1. C. Van Haesendonck
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  2. M. Gijs
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  3. Y. Bruynseraede
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Editor information

Editors and Affiliations

  1. Physikalisch-Technische Bundesanstalt Braunschweig, Postfach 3345, D-3300, Braunschweig, Fed. Rep. of Germany

    Bernhard Kramer

  2. Kernforschungsanlage Jülich, Institut für Festkörperforschung, Postfach 1913, D-5170, Jülich, Fed. Rep. of Germany

    Gerd Bergmann

  3. Laboratorium voor Vaste Stof-Fysika en Magnetisme, Celestijnenlaan 200 D, B-3030, Leuven, Belgium

    Yvan Bruynseraede

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© 1985 Springer-Verlag Berlin Heidelberg

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Van Haesendonck, C., Gijs, M., Bruynseraede, Y. (1985). Electron Scattering Times in Thin Metal Films Experimental Results. In: Kramer, B., Bergmann, G., Bruynseraede, Y. (eds) Localization, Interaction, and Transport Phenomena. Springer Series in Solid-State Sciences, vol 61. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-82516-3_22

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  • DOI: https://doi.org/10.1007/978-3-642-82516-3_22

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-82518-7

  • Online ISBN: 978-3-642-82516-3

  • eBook Packages: Springer Book Archive

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