Surface Structure Determination with ARPEFS
We describe a method of surface structure determination based on oscillations in core-level photoemission intensity-Angle-Resolved Photoemission Extended Fine Structure-with particular emphasis on the use of Fourier transformation. Qualitative comparisons of Fourier power spectra reveal adsorption sites and shortcomings in theoretical calculations; quantitative backtransformation analysis allows accurate bond lengths and bond angles to be determined. Examples are drawn from these similar atomic adsorption systems: c(2×2)S/Ni(100), p(2×2)S/Cu(100) and c(2×2)S/Ni(110).
KeywordsFourier Spectrum Normal Emission Partial Cross Section Scatter Phase Shift Fourier Power Spectrum
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