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Surface Structure Determination with ARPEFS

  • J. J. Barton
  • S. W. Robey
  • C. C. Bahr
  • D. A. Shirley
Part of the Springer Series in Surface Sciences book series (SSSUR, volume 2)

Abstract

We describe a method of surface structure determination based on oscillations in core-level photoemission intensity-Angle-Resolved Photoemission Extended Fine Structure-with particular emphasis on the use of Fourier transformation. Qualitative comparisons of Fourier power spectra reveal adsorption sites and shortcomings in theoretical calculations; quantitative backtransformation analysis allows accurate bond lengths and bond angles to be determined. Examples are drawn from these similar atomic adsorption systems: c(2×2)S/Ni(100), p(2×2)S/Cu(100) and c(2×2)S/Ni(110).

Keywords

Fourier Spectrum Normal Emission Partial Cross Section Scatter Phase Shift Fourier Power Spectrum 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

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Copyright information

© Springer-Verlag Berlin Heidelberg 1985

Authors and Affiliations

  • J. J. Barton
    • 1
    • 2
  • S. W. Robey
    • 1
    • 2
  • C. C. Bahr
    • 1
    • 2
  • D. A. Shirley
    • 1
    • 2
  1. 1.Materials and Molecular Research DivisionLawrence Berkeley LaboratoryBerkeleyUSA
  2. 2.Departments of Chemistry and PhysicsUniversity of CaliforniaBerkeleyUSA

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