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Reflection Electron Microscopy Studies of Crystal Lattice Termination at Surfaces

  • Tung Hsu
  • J. M. Cowley
Part of the Springer Series in Surface Sciences book series (SSSUR, volume 2)

Abstract

Reflection Electron Microscopy (REM) is applied to the imaging of stacking faults immediately beneath the surface of bulk crystals. Strong contrast is obtained on stacking fault ribbons in graphite. The contrast on Pt(lll) surfaces is also attributed to the stacking sequence change of the topmost layer of atoms.

Keywords

Bulk Crystal Diffraction Spot Reflection High Energy Electron Diffraction Atomic Step High Resolution Electron Microscopy 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

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Copyright information

© Springer-Verlag Berlin Heidelberg 1985

Authors and Affiliations

  • Tung Hsu
    • 1
  • J. M. Cowley
    • 1
  1. 1.Department of PhysicsArizona State UniversityTempeUSA

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