Abstract
Lasers offer a diverse approach to fabricating oxide films for a wide variety of applications. This paper will review the field of laser oxidation in general but particular attention will be focused on oxide formation on silicon. Two main areas will be detailed, namely Laser Chemical Vapor Deposition (LCVD) and Laser Pyrolytic Growth (LPG). The kinetics involved with film preparation will be discussed while the various structural, optical and electrical properties of the films will be compared.
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References
S. T. Pantelides, “The Physics of SiO2 and Its Interfaces” (Pergamon, New York 1978) and references therein.
B. E. Deal in “Semiconductor Silicon”, eds. H. R. Huff, E. Sirtl ( Electrochem. Soc., Princeton, 1977 ), p. 276.
P.A. Bertrand, P.D. Fleischauer, J. Vac. Sci. Tech., B1, 832 (1983).
G. W. Anderson, W. A. Schmidt, J. Comas, see ref. 1, p. 200.
N. Goldsmith, W. Kern, RCA Rev., 28, 153 (1967).
L. I. Maissel, in “Handbook of Thin Film Technology,” L. I. Maissei, R. Glang (McGraw-Hill, NY 1970) Ch. 4; J. L. Vossen, 1971, J. Vac. Sci. Technol., 8, 512 (1971).
W. A. Pliskin, R. A. Gdula, in “Handbook on Semiconductors,” ed. T. S. Moss, 3, Ch. 11 (1982).
K. Urbanek, Solid State Tech. 20 (4), 87 (1977).
See for example S. Dzioba, G. Este, H. M. Naguib, J. Electrochem. Soc., 129, 2537 (1982), and references therein.
V. Q. Ho, Jpn. J. Appi. Phys. Suppl., 1, 19, 103 (1983).
T. Tokuyama, these proceedings.
J. R. Ligenza, W. G. Spicer, J. Phys. Chem. Solids, 14, 132 (1960).
R. J. Zeto, N. O. Korolkoff, S. Marshall, Solid State Technology, 22 (7), 62 (1979).
H. Gilgen, C. J. Chen, R. Krchnavek, R. M. Osgood, these proceedings.
W.M. Cosney, L.H. Hall, IEEE Trans. Electron. Dev., ED-20, 469 (1973).
Laser Diagnostics and Photochemical Processing for Semiconductor Devices, R. M. Osgood, S. R. J. Brueck, H. R. Schlossberg, (North-Holland, New York, 1983), and references therein.
D. J. Ehrlich, J. Y. Tsao, J. Vac. Sci. Technol., B1, 969, (1983).
R. F. Marks, R. A. Pollak, Ph. Avouris, in ref. 16, p. 257.
R. F. Marks, R. A. Pollak, (unpublished), see ref. 18.
M. Wautelet, L. Baufay, Thin Solid Films, 100, L9 (1983).
R. Solanki, W. Ritchie, G. J. Collins, Appi. Phys. Lett. 43, 454 (1983).
R. Solanki, G. J. Collins, Appi. Phys. Lett., 42, 662 (1983).
H. Sankur, J. T. Cheung, J. Vac. Sci. Technol., A1, 1806 (1983).
S. M. Metev, S. K. Savtchenko, K. Stamenov, J. Phys. D13, L75 (1980).
I. Ursu, L. C. Nistor, V. S. Teodorescu, I. N. Mihailescu, I. Apostol, L. Nanu, A. M. Prokhorov, N. I. Chapliev, V. I. Konov, V. N. Tokarev, V. G. Raichenko, SPIE Ind. Appi, of Lasers, V398, paper 398–69 (1983).
M. Matsuura, M. Ishida, A. Suzuki, K. Hara, Japan J. Appi. Phys., 20, L726, (1981).
W. G. Petro, I. Hino, S. Eglash, I. Lindau, C. Y. Su, W. E. Spicer, J. Vac. Sci. Technol., 21, 405 (1982).
Ian W., Boyd, Contemporary Physics, 24, 461 (1983).
S.W. Chiang, Y.S. Liu, R.F. Reihl, Appi. Phys. Lett., 39, 752 (1981).
A. Garulli, M. Servidori, I. Vecchi, J. Phys. D, 13, L199 (1981).
I. W. Boyd, Appi. Phys., A31, 71 (1983).
K. Hoh, H.Koyama, K.Uda, Y. Miura, Japan J.Appi.Phys, 19, L375 (1980).
T. E. Orlowski and H. Richter, in “Laser-Control Chemical Processing of Surfaces,” A. W. Johnson, D. J. Ehrlich ( North-Holland, New York, 1984 ).
Y. S. Liu S. W. Chiang, F. Bacon, Appi. Phys. Lett., 38, 1005, (1981).
J. F. Gibbons, Japan. J. Appi. Phys. Suppl. 19, 121, (1981).
I.W. Boyd, J.I.B. Wilson, J.L. West, Thin Solid Films, 83 L173 (1981).
I. W. Boyd, J. I. B. Wilson, Appi. Phys. Letts. 41, 162, (1982).
A. Cros, F. Salvan, J. Derrien, Appi. Phys., A28, 241 (1982).
S.E. Blum, K. Brown, R. Srinivasan, Appi.Phys. Lett., 43, 1026 (1983).
P. K. Boyer, G. A. Roche, W. H. Ritchie, G. J. Collins, Appi. Phys. Lett., 40, 716 (1982).
P.K. Boyer, W. H. Ritchie, G. J. Collins, J. Electrochem. Soc., 129, 2155 (1982).
S. Szikora, W. Kräuter, D. Bauerle, Materials Letters, 2, 263 (1984).
B. J. Baliga, S. K. Ghandi, J. Appi. Phys., 44, 990 (1973).
J. W. Peters, Technical Digest of the International Electron Devices Meeting, (1981), p. 240.
Y. Mishima, M.Hirose, Y.Osaka, Y.Ashida, J. Appl. Phys. 55, 1234 (1984).
S. A. Schäfer and S. A. Lyon, J. Vac. Sci. Technol., 19, 494 (1981).
S. A. Schäfer and S. A. Lyon, J. Vac. Sci. Technol., 21, 422 (1982).
E. M. Young and W. A. Tiller, Appi. Phys. Lett., 42, 63 (1983).
I. W. Boyd, T. D. Binnie, J. I. B. Wilson, M. J. Colles, J. Appi. Phys., 55, 3061 (1984), and references therein.
I. W. Boyd, J. Appi. Phys. 54, 3561 (1983).
F. Ferrieu, G. Auvert, J. Appi. Phys., 54, 2646 (1983), and references therein.
I. W. Boyd, in “Surface Studies with Lasers,” F. R. Aussenegg, A. Leitner, M. E. Lippitsch (Springer Berlin, 1983 ).
I. W. Boyd, Appi. Phys. Lett., 42, 728 (1983).
B. E. Deal, A. S. Grove, J. Appi. Phys. 36, 3770 (1965).
A. G. Revesz, R. J. Evans, J. Phys. Chem. Solids, 30, 551 (1969).
E. A. Irene, J. Appi. Phys. 54, 5416 (1983).
A. S. Grove, “Physics and Technology of Semiconductor Devices,” ( Wiley, New York, 1967 ).
W. A. Tiller, J. Electrochem. Soc., 127, 625 (1980).
A. Fargeix, G. Ghibaudo, G. Kamarinos, J. Appi. Phys. 54, 2878 (1983).
A. Lora-Tamayo, E. Dominguez, E. Lora-Tamayo, J. Llabres, Appi. Phys. 17, 79 (1978).
R. Ghez, Y. J. van der Meulen, J. Electrochem. Soc., 119, 1100 (1972).
J. Blanc, Appi. Phys. Lett., 33, 424 (1978).
S. M. Hu, Appi. Phys. Lett., 42, 872 (1983).
A. Goodman, Phys. Rev., 152, 785 (1966).
M. Wautelet, Materials Letters, 2, 20 (1984).
E. Harari, J. Appi. Phys. 49, 2478 (1978).
C. M. Osburn, D. W. Ormond, J. Electrochem. Soc., 119, 591 (1972).
I. H. Pratt, S. S. Technol, 12 (12), 49 (1969).
V. M. Donnelly, M. Geva, J. Long, R. F. Karlicek, Appi. Phys. Lett., 44, 951 (1984).
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Boyd, I.W. (1984). Laser Assisted Pyrolytic Growth and Photochemical Deposition of Thin Oxide Films. In: Bäuerle, D. (eds) Laser Processing and Diagnostics. Springer Series in Chemical Physics, vol 39. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-82381-7_37
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DOI: https://doi.org/10.1007/978-3-642-82381-7_37
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