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Picosecond Optoelectronic Studies of Microstrip Dispersion

  • D. E. Cooper
Conference paper
Part of the Springer Series in Chemical Physics book series (CHEMICAL, volume 38)

Abstract

Picosecond optoelectronic techniques permit the impulse response of solidstate electronic devices to be measured with a temporal resolution of a few picoseconds [1]. The technique is based upon the use of optoelectronic switches, which convert picosecond optical pulses to picosecond electrical pulses and also act as picosecond-aperture sampling gates. The achievable temporal resolutions correspond to frequency bandwidths that far exceed the capabilities of conventional measurement techniques. A major application of the picosecond optoelectronic technique has been the measurement of the impulse response of fast transistors, yielding information about the transistor’s frequency bandwidth and switching delay. Here we report on measurements of the propagation and distortion of short electrical pulses on microstrip lines, with an analysis of the results in terms of the microstrip dispersion and losses.

Keywords

Loss Factor Electrical Pulse Microstrip Line Pulse Profile Switching Delay 
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References

  1. 1.
    P.R. Smith, D.H. Auston, and W.M. Augustyniak: Appl. Phys. Lett. 39, 739 (1981)Google Scholar
  2. 2.
    G. Hasnain, G. Arjavalingam, A. Dienes, and J.R. Whinnery: “Dispersion of Picosecond Pulses on Microstrip Transmission Lines”, in SPIE, Proceedings, Vol. 439, pp. 159–163Google Scholar
  3. 3.
    Roger P. Owens, James E. Aitken, and Terrence C. Edwards: IEEE Transactions MTT-24, 499 (1976)Google Scholar
  4. 4.
    K.C. Gupta, Ramesh Garg, and I.J. Bahl: Microstrip Lines and Slotlines (Artech, Dedham, Mass. 1979 )Google Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 1984

Authors and Affiliations

  • D. E. Cooper
    • 1
  1. 1.Chemistry and Physics LaboratoryThe Aerospace CorporationLos AngelesUSA

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