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Secondary Ion Mass Spectrometry SIMS IV pp 342–356Cite as

Organic Secondary Ion Mass Spectrometry

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Part of the book series: Springer Series in Chemical Physics ((CHEMICAL,volume 36))

Abstract

Organic SIMS is based on the primarily unexpected fact that sputtering of even involatile and thermally labile organic molecules results in-the formation of parent-like secondary ions, as (M+H)+ and (M-H)-, e.g. [1–3]. In addition, characteristic fragment ions are generated.

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References

  1. A.Benninghoven, D.Jaspers, W.Sichtermann: Appl.Phys. 11, 35 (1976)

    Article  CAS  Google Scholar 

  2. A.Benninghoven, W.Sichtermann: Org.Mass Spectrom. 12, 595 (1977)

    Article  CAS  Google Scholar 

  3. A.Benninghoven, W.Sichtermann: Anal.Chem. 50, 1180 (1978)

    Article  CAS  Google Scholar 

  4. A.Benninghoven, ed., Springer Series in Chemical Physics, Vol. 25, Springer-Verlag, Berlin-Heidelberg-New York-Tokyo, 1983

    Google Scholar 

  5. A.Benninghoven et al., eds., Springer Series in Chemical Physics, Vol. 19, Springer-Verlaq, Berlin-Heidelberg-New York, 1982

    Google Scholar 

  6. M.Barber, R.S.Bordoli, R.D.Sedgwick, A.N.Tyler: J.C.S.Chem. Comm., 325 (1981)

    Google Scholar 

  7. A.Benninghoven: Surf.Sci. 35, 427 (1973)

    Article  CAS  Google Scholar 

  8. A.Benninghoven: Surf.Sci. 53, 596 (1975)

    Article  CAS  Google Scholar 

  9. B.T.Chait, K.G.Standing : Int.J.Mass Spectrom.Ion Phys. 40, 185 (1981)

    Article  CAS  Google Scholar 

  10. P.Steffens, E.Niehuis, T.Friese, A.Benninghoven, in [4], p. 111

    Google Scholar 

  11. A.Benninghoven, in [5], p. 438

    Google Scholar 

  12. A.Benninghoven, in [4], p. 6 4

    Google Scholar 

  13. A.Benninghoven, M.Junack, W.Sichtermann, to be published

    Google Scholar 

  14. W.Aberth, K.M.Straub, A.L.Burlingame, in [4], p. 167

    Google Scholar 

  15. C.Fenselau, in [4], p. 90

    Google Scholar 

  16. C.E.Costello, A.M.Van Langenhove, S.A.Martin, K.Biemann, in [4], p. 173

    Google Scholar 

  17. H.Kambara, in [4], p. 101

    Google Scholar 

  18. E.Niehuis: Diploma work, Muenster 1981

    Google Scholar 

  19. W.Lange, M.Jirikowsky, A.Benninghoven: Surf.Sci. 136, 419 (1984)

    Article  CAS  Google Scholar 

  20. P.Steffens, E.Niehuis, T.Friese, D.Greifendorf, A.Benninghoven: these proceedings

    Google Scholar 

  21. A.Benninghoven, E.Niehuis, T.Friese, D.Greifendorf, P.Steffens: Org.Mass Spectrom., in press

    Google Scholar 

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Author information

Authors and Affiliations

  1. Physikalisches Institut, Universität Münster, Domagkstraße 75, Münster, D-4400, Fed. Rep. of Germany

    A. Benninghoven

Authors
  1. A. Benninghoven
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Editor information

Editors and Affiliations

  1. Phsysikalisches Inst., Universität Münster, Münster, D-4400, Fed. Rep. of Germany

    A. Benninghoven

  2. College of General Education, Osaka University, Osaka 560, Japan

    J. Okano

  3. Department of Applied Physics, Osaka University, Osaka 565, Japan

    R. Shimizu

  4. Philips Research Laboratories, Eindhoven, The Netherlands

    H. W. Werner

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© 1984 Springer-Verlag Berlin Heidelberg

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Benninghoven, A. (1984). Organic Secondary Ion Mass Spectrometry. In: Benninghoven, A., Okano, J., Shimizu, R., Werner, H.W. (eds) Secondary Ion Mass Spectrometry SIMS IV. Springer Series in Chemical Physics, vol 36. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-82256-8_91

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  • DOI: https://doi.org/10.1007/978-3-642-82256-8_91

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-82258-2

  • Online ISBN: 978-3-642-82256-8

  • eBook Packages: Springer Book Archive

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