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Organic Secondary Ion Mass Spectrometry

  • A. Benninghoven
Part of the Springer Series in Chemical Physics book series (CHEMICAL, volume 36)

Abstract

Organic SIMS is based on the primarily unexpected fact that sputtering of even involatile and thermally labile organic molecules results in-the formation of parent-like secondary ions, as (M+H)+ and (M-H)-, e.g. [1–3]. In addition, characteristic fragment ions are generated.

Keywords

Primary Particle Liquid Matrix Sample Molecule High Mass Range Glycerol Matrix 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag Berlin Heidelberg 1984

Authors and Affiliations

  • A. Benninghoven
    • 1
  1. 1.Physikalisches InstitutUniversität MünsterMünsterFed. Rep. of Germany

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