Abstract
It appears that secondary ion mass spectrometry plays an important part in biological fields. This paper discusses the elimination of the charge accumulated under the primary ion beam at the surface of non-conductive samples. It also discusses spectral interferences with molecular and their fragment ion spectra, and quantitative SIMS analysis using concentration of an implanted primary ion species as an internal standard element.
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References
H. Tamura, T. Ishitani, E. Izumi: Mass Spectroscopy, 29, 3, 221 (1981)
H. Tamura, J. Tadano, H. Okano: Mass Spectroscopy, 30, 3, 239 (1982)
J.C.C Tsai, J.M. Morabito: Surface Sci., 44, 247(1974)
H. Tamura, T. Ishitani, E. Izumi: Mass Spectroscopy, 29, 1, 81 (1981)
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© 1984 Springer-Verlag Berlin Heidelberg
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Tamura, H., Tadano, J., Okano, H. (1984). An Empirical Approach to Quantitative Analysis of Biological Samples by Secondary Ion Mass Spectrometry (SIMS). In: Benninghoven, A., Okano, J., Shimizu, R., Werner, H.W. (eds) Secondary Ion Mass Spectrometry SIMS IV. Springer Series in Chemical Physics, vol 36. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-82256-8_130
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DOI: https://doi.org/10.1007/978-3-642-82256-8_130
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-82258-2
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