Abstract
Quantitative SIMS data can be obtained either by using working curve methods based both on combined secondary ion microprobe and electron microprobe analyses [1, 2] or using various methods of purifying of each isotopic peak [3]. Although almost all SIMS studies on geological samples are made on natural and synthesized crystals and glasses, few applications to metastable minerals showing exsolved microstructure are found mainly because of difficulty in explanation of inhomogeneity of the surface and the formation process.
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© 1984 Springer-Verlag Berlin Heidelberg
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Miura, Y., Tomisaka, T. (1984). Quantitative SIMS Analysis of Metastable Plagioclase in Boggild Intergrowth. In: Benninghoven, A., Okano, J., Shimizu, R., Werner, H.W. (eds) Secondary Ion Mass Spectrometry SIMS IV. Springer Series in Chemical Physics, vol 36. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-82256-8_119
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DOI: https://doi.org/10.1007/978-3-642-82256-8_119
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