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Structural Characterization of Naturally Occurring Oligosaccharides by Matrix-Assisted Molecular Secondary Ion Mass Spectrometry

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Secondary Ion Mass Spectrometry SIMS IV

Part of the book series: Springer Series in Chemical Physics ((CHEMICAL,volume 36))

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Abstract

Normally, a glycerol matrix is essential in sputtered ion mass spectrometry such as fast atom bombardment (FAB) and molecular secondary ion mass spectrometry (SIMS) [1]. Recently, we have successfully applied an amine matrix, diethanolamine (DEA) and triethanolamine (TEA), instead of glycerol for the determination of molecular weight of neutral oligosaccharides by molecular SIMS [2]. When DEA was used, a stable molecular adduct ion species, the [M+DEAH]+ ion, was formed as the sole ion derived from a neutral saccharide molecule and no fragment ions were detected. Moreover, the [M+DEAH]+ ion scarcely decomposed even under collisionally activated dissociation (CAD) conditions.

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References

  1. K.L. Rinehart, Jr.: Science 218 254 (1982)

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  2. K.-I. Harada and M. Suzuki: Org. Mass Spectrom. 17, 386 (1982)

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  3. K.-I. Harada and M. Suzuki: Tetrahedron Lett. 23, 2481 (1982)

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  4. K.-I. Harada and M. Suzuki: Org. Mass Spectrom. 18, 447 (1983)

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© 1984 Springer-Verlag Berlin Heidelberg

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Suzuki, M., Harada, KI., Tatematsu, A., Kambara, H. (1984). Structural Characterization of Naturally Occurring Oligosaccharides by Matrix-Assisted Molecular Secondary Ion Mass Spectrometry. In: Benninghoven, A., Okano, J., Shimizu, R., Werner, H.W. (eds) Secondary Ion Mass Spectrometry SIMS IV. Springer Series in Chemical Physics, vol 36. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-82256-8_109

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  • DOI: https://doi.org/10.1007/978-3-642-82256-8_109

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-82258-2

  • Online ISBN: 978-3-642-82256-8

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