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Depth Profiling of Polymer Blends and Optical Fiber with the Aid of SIMS

  • R. Chûjô
  • T. Nishi
  • Y. Sumi
  • T. Adachi
  • H. Naitoh
  • H. Fenzel
Part of the Springer Series in Chemical Physics book series (CHEMICAL, volume 36)

Abstract

In inhomogeneous polymer blends we cannot expect a homogeneous distribution of each component along the direction vertical to the free surface. Even in homogeneous polymer blends the distribution might be affected by the surface energy. This leads to the importance of the establishment of a depth profiling method. For polymer blends, AKIYAMA(1) has classified characterization methods into three categories: morphological, chemicophysical, and thermodynamic. They have been appreciated as useful methods. Besides these methods, the present authors would like to propose an application of the secondary ion mass spectrometry (SIMS) as a useful method for characterizing polymer blends, especially for depth profiling.

Keywords

Optical Fiber Depth Profile Methyl Methacrylate Polymer Blend Benzoyl Peroxide 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag Berlin Heidelberg 1984

Authors and Affiliations

  • R. Chûjô
    • 1
  • T. Nishi
    • 2
  • Y. Sumi
    • 2
  • T. Adachi
    • 3
  • H. Naitoh
    • 3
  • H. Fenzel
    • 4
  1. 1.Department of Polymer ChemistryTokyo Institute of TechnologyMeguro-ku, Tokyo 152Japan
  2. 2.Department of Physical EngineeringThe University of TokyoBunkyo-ku, Tokyo 113Japan
  3. 3.Seiko Instruments and Electronics Ltd.Koto-ku, Tokyo 136Japan
  4. 4.Atomika Technische Physik GmbHMünchenFed. Rep. of Germany

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