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Surface Structure of Oxidized Metals Bombarded by Incident Ions

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Secondary Ion Mass Spectrometry SIMS IV

Part of the book series: Springer Series in Chemical Physics ((CHEMICAL,volume 36))

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Abstract

On the metal surface bombarded by incident ions, there is recognized the irregular pattern by TSUNOYAMA (1), that is called a cone. The cone affects inexplicably on the precision of ion mass spectrometry. However, the mechanism of cone growth is not well revealed. To clarify this, the experiment using 42%Ni-Fe alloy has been carried out in the ion mass analyzer.

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References

  1. K.Tsunoyama, Y.Ohashi et al.: J. Appl. Phy. 13, 1683(1974)

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© 1984 Springer-Verlag Berlin Heidelberg

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Sekimoto, Y., Igarashi, Y., Kawata, T. (1984). Surface Structure of Oxidized Metals Bombarded by Incident Ions. In: Benninghoven, A., Okano, J., Shimizu, R., Werner, H.W. (eds) Secondary Ion Mass Spectrometry SIMS IV. Springer Series in Chemical Physics, vol 36. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-82256-8_10

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  • DOI: https://doi.org/10.1007/978-3-642-82256-8_10

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-82258-2

  • Online ISBN: 978-3-642-82256-8

  • eBook Packages: Springer Book Archive

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