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Determination by Ion Scattering of Atomic Positions at Surfaces and Interfaces

  • W. M. Gibson
Chapter
Part of the Springer Series in Chemical Physics book series (CHEMICAL, volume 35)

Abstract

Knowledge of the atomic configuration is important to understanding chemical, electronic and mechanical processes at crystal surfaces and interfaces. During the past ten years Ion-Scattering Spectroscopy (ISS) has emerged as a powerful and direct tool to get such information. Application and analysis of ion scattering divides more or less naturally into three energy regimes, Low-Energy Ion Scattering (LEIS) (1–20 kev); Medium-Energy Ion Scattering (MEIS) (20–200 kev); and High-Energy Ion scattering (HEIS) (200 kev−2 Mev). This review will concentrate on the physics, techniques and applications of HEIS with particular attention to studies of atomic structure at interfaces — an application for which it is virtually unique. Although for completeness there will necessarily be some overlap of this review with previous reviews [18.1–3] including one in the present series [18.4], the extensive discussion of the principles and details of the technique in those reviews will permit greater concentration here on recent applications and results.

Keywords

Oxygen Exposure Substrate Atom Surface Peak Oxygen Coverage Exit Surface 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag Berlin Heidelberg 1984

Authors and Affiliations

  • W. M. Gibson

There are no affiliations available

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