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Determination by Ion Scattering of Atomic Positions at Surfaces and Interfaces

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Chemistry and Physics of Solid Surfaces V

Part of the book series: Springer Series in Chemical Physics ((CHEMICAL,volume 35))

Abstract

Knowledge of the atomic configuration is important to understanding chemical, electronic and mechanical processes at crystal surfaces and interfaces. During the past ten years Ion-Scattering Spectroscopy (ISS) has emerged as a powerful and direct tool to get such information. Application and analysis of ion scattering divides more or less naturally into three energy regimes, Low-Energy Ion Scattering (LEIS) (1–20 kev); Medium-Energy Ion Scattering (MEIS) (20–200 kev); and High-Energy Ion scattering (HEIS) (200 kev−2 Mev). This review will concentrate on the physics, techniques and applications of HEIS with particular attention to studies of atomic structure at interfaces — an application for which it is virtually unique. Although for completeness there will necessarily be some overlap of this review with previous reviews [18.1–3] including one in the present series [18.4], the extensive discussion of the principles and details of the technique in those reviews will permit greater concentration here on recent applications and results.

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Authors
  1. W. M. Gibson
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Editors and Affiliations

  1. Department of Chemistry and Laboratory for Surface Studies, The University of Wisconsin-Milwaukee, 53201, Milwaukee, WI, USA

    Ralf Vanselow

  2. Department of Chemistry, University of Auckland, Private Bag, Auckland, New Zealand

    Russell Howe

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© 1984 Springer-Verlag Berlin Heidelberg

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Gibson, W.M. (1984). Determination by Ion Scattering of Atomic Positions at Surfaces and Interfaces. In: Vanselow, R., Howe, R. (eds) Chemistry and Physics of Solid Surfaces V. Springer Series in Chemical Physics, vol 35. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-82253-7_18

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  • DOI: https://doi.org/10.1007/978-3-642-82253-7_18

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-82255-1

  • Online ISBN: 978-3-642-82253-7

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