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Determination of Surface Structure Using Atomic Diffraction

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Book cover Chemistry and Physics of Solid Surfaces V

Part of the book series: Springer Series in Chemical Physics ((CHEMICAL,volume 35))

Abstract

Atom diffraction from surfaces is both a very old and a rather new area of research in surface science. The first study of this phenomenon [11.1] verified the wave nature of light particles by scattering He from Li F{100}. Subsequent work was almost entirely confined to scattering from Li F{100} and graphite {0001} for many years [11.2–4] largely due to fact that only inert surfaces could be studied because of the poor vacuum conditions available to most of these investigators. Although this restricted the types of surfaces which could be studied, much was learned about the atom-surface potential and a theoretical framework was developed to calculate diffraction intensities from surfaces. The first UHV study of atom diffraction [11.5] rekindled interest in this area and was followed by a variety of studies on close packed metal surfaces. Thes original studies are discussed in recent comprehensive reviews of atom diffraction from surfaces [11.6,7]. These articles also refer to earlier excellent reviews of the subject which cannot be discussed in the present article for reasons of brevity.

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Authors
  1. T. Engel
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Editors and Affiliations

  1. Department of Chemistry and Laboratory for Surface Studies, The University of Wisconsin-Milwaukee, 53201, Milwaukee, WI, USA

    Ralf Vanselow

  2. Department of Chemistry, University of Auckland, Private Bag, Auckland, New Zealand

    Russell Howe

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© 1984 Springer-Verlag Berlin Heidelberg

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Engel, T. (1984). Determination of Surface Structure Using Atomic Diffraction. In: Vanselow, R., Howe, R. (eds) Chemistry and Physics of Solid Surfaces V. Springer Series in Chemical Physics, vol 35. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-82253-7_11

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  • DOI: https://doi.org/10.1007/978-3-642-82253-7_11

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-82255-1

  • Online ISBN: 978-3-642-82253-7

  • eBook Packages: Springer Book Archive

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