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Surface Crystallography by Means of SEXAFS and NEXAFS

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Chemistry and Physics of Solid Surfaces V

Part of the book series: Springer Series in Chemical Physics ((CHEMICAL,volume 35))

Abstract

The availability of high brightness (flux/unit area) monochromatized synchrotron radiation [10.1] has allowed the development of new experimental techniques which tune into specific surface atoms and probe their structural environment. Two such techniques, the subject of this chapter, are the surface extended X-ray absorption fine structure (SEXAFS) and near-edge X-ray absorption fine structure (NEXAFS) techniques. Both measure the X-ray absorption by a specific atom on the surface which is distinguished from other atoms by one of its main absorption edges (usually K or L edge).

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Authors
  1. J. Stöhr
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Editors and Affiliations

  1. Department of Chemistry and Laboratory for Surface Studies, The University of Wisconsin-Milwaukee, 53201, Milwaukee, WI, USA

    Ralf Vanselow

  2. Department of Chemistry, University of Auckland, Private Bag, Auckland, New Zealand

    Russell Howe

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© 1984 Springer-Verlag Berlin Heidelberg

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Stöhr, J. (1984). Surface Crystallography by Means of SEXAFS and NEXAFS. In: Vanselow, R., Howe, R. (eds) Chemistry and Physics of Solid Surfaces V. Springer Series in Chemical Physics, vol 35. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-82253-7_10

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  • DOI: https://doi.org/10.1007/978-3-642-82253-7_10

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-82255-1

  • Online ISBN: 978-3-642-82253-7

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