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Surface Crystallography by Means of SEXAFS and NEXAFS

  • J. Stöhr
Chapter
Part of the Springer Series in Chemical Physics book series (CHEMICAL, volume 35)

Abstract

The availability of high brightness (flux/unit area) monochromatized synchrotron radiation [10.1] has allowed the development of new experimental techniques which tune into specific surface atoms and probe their structural environment. Two such techniques, the subject of this chapter, are the surface extended X-ray absorption fine structure (SEXAFS) and near-edge X-ray absorption fine structure (NEXAFS) techniques. Both measure the X-ray absorption by a specific atom on the surface which is distinguished from other atoms by one of its main absorption edges (usually K or L edge).

Keywords

Near Neighbor Diatomic Molecule Shape Resonance Near Neighbor Distance Core Hole 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag Berlin Heidelberg 1984

Authors and Affiliations

  • J. Stöhr

There are no affiliations available

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