Abstract
The occurrence of multiple diffraction depends on the geometrical aspects of the crystal itself and the relative arrangement of the crystal with respect to the incident radiation. These geometrical factors are the interatomic distances, the space group to which the crystal belongs, the wavelength of the radiation, and the experimental arrangement. This chapter describes the general aspect of the geometry of multiple diffraction and provides a detailed account of each experimental technique by which multiple diffractions are generated. A description of the methods of identifying multiple diffraction peaks and lines follows.
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Chang, SL. (1984). Geometry, Peak Indexing, and Experimental Techniques. In: Multiple Diffraction of X-Rays in Crystals. Springer Series in Solid-State Sciences, vol 50. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-82166-0_2
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DOI: https://doi.org/10.1007/978-3-642-82166-0_2
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