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Multiple Diffraction of X-Rays in Crystals pp 1–6Cite as

Introduction

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Part of the book series: Springer Series in Solid-State Sciences ((SSSOL,volume 50))

Abstract

Multiple diffraction, in contrast to a simple Bragg—the so-called two-beam (incident and reflected) ∔ reflection, occurs when several sets of atomic planes in a crystal are simultaneously brought into position to diffract an incident x-ray beam. The interaction among the diffracted beams within the crystal gives rise to an increase or a decrease in the intensity of a given two- beam reflection. The decrease in intensity, which brightens the two-beam diffraction images on an x-ray film (a negative), is called ‘Aufhellung’. This phenomenon was first discovered by Wagner in 1923 [1.1] and extensively investigated by Berg [1.2].

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  1. Instituto de Física, Universidade Estadual de Campinas, Caixa Postal 1170, 13100, Campinas, São Paulo, Brazil

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Chang, SL. (1984). Introduction. In: Multiple Diffraction of X-Rays in Crystals. Springer Series in Solid-State Sciences, vol 50. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-82166-0_1

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