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Phonon Scattering at Electronically Degenerative Systems: An Application to the Defect Systems Si(In), Si(B), and GaAs(Mn)

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Book cover Phonon Scattering in Condensed Matter

Part of the book series: Springer Series in Solid-State Sciences ((SSSOL,volume 51))

Abstract

Phonon scattering experiments at the Г8 ground state of acceptors in cubic semiconductors as Si(In), Si(B), and GaAs(Mn) show a specific resonance structure in the meV range [1], [2], which can be explained by a dynamical Jahn-Teller effect [3].However, due to the large extension of the defect wave function (5–15 Å) the influence of random internal fields is reinforced, which causes a static splitting of the Г8 state. We present a first step to a unified description of the phonon scattering processes including the influences of static fields together with the dynamical electron-phononinteraction.

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References

  1. Holland, M.G., Proc. 7th Int. Conf. Semicond., Paris (1964) Schad, Hp., Laßmann, K., Phys. Lett. 56A, 409 (1976)

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  2. de Combarieu, A., Laßmann, K., in: Phonon Scattering in Solids, New York (1976)

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  3. Sigmund, E., Laßmann, K., in: Phonon Scattering in Cond. Matter New York (1980)

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  4. Sigmund, E., Laßmann, K., phys. stat. sol.(b) 111, 631 ( 1982 ) Maier, J., Sigmund, E., to be published (1983)

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Author information

Authors and Affiliations

  1. Institut für Theoretische Physik, Universität Stuttgart, Pfaffenwaldring 57, D-7000, Stuttgart 80, Fed. Rep. of Germany

    J. Maier & E. Sigmund

Authors
  1. J. Maier
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  2. E. Sigmund
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Editors and Affiliations

  1. Physikalisches Institut, Universität Stuttgart, Pfaffenwaldring 57, D-7000, Stuttgart 80, Fed. Rep. of Germany

    Wolfgang Eisenmenger , Kurt Laßmann  & Siegfried Döttinger ,  & 

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© 1984 Springer-Verlag Berlin Heidelberg

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Maier, J., Sigmund, E. (1984). Phonon Scattering at Electronically Degenerative Systems: An Application to the Defect Systems Si(In), Si(B), and GaAs(Mn). In: Eisenmenger, W., Laßmann, K., Döttinger, S. (eds) Phonon Scattering in Condensed Matter. Springer Series in Solid-State Sciences, vol 51. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-82163-9_89

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  • DOI: https://doi.org/10.1007/978-3-642-82163-9_89

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-82165-3

  • Online ISBN: 978-3-642-82163-9

  • eBook Packages: Springer Book Archive

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