Measurement of Weak Optical Absorption at Surfaces Using Lateral Waves
The use of visible radiation for probing surface regions on the scale of atomic layers appears at first sight unpromising. However the case of detecting photons and of manipulating light beams — e.g. as in ellipsometry, which is capable of detecting a fraction of a monolayer — means that optical techniques can play a useful part in surface and interface studies. In this paper the possible use is explored of the lateral wave which is excited at an interface when a bounded beam of radiation is incident at a boundary in the dense of two media and at the critical angle.
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