Skip to main content

Practical Lens Design

  • Chapter
Magnetic Electron Lenses

Part of the book series: Topics in Current Physics ((TCPHY,volume 18))

Abstract

The physical background and many practical considerations concerning the design and construction of magnetic electron lenses are explained. In a short historical introduction the evolution of lens design principles is outlined. General rules for establishing a suitable working point are discussed for each of the fundamental operating modes: as an objective, as a projector, and as a condenser. Optimization of magnetic lenses with respect to geometric optical aberrations is also described. The design of the magnetic circuit of the lens is explained, starting with the pole-piece system and completing it with a suitably shaped casing. Turning to other essential components of magnetic lenses, the design of lens coils is treated as well as that of stigmators, of aperture alignment and exchange systems, and of mechanical lens alignment devices. Measures are described that reduce the sensitivity of the magnetic lens to environmental vibrations and stray magnetic fields. The general layout of electron optical systems composed of permanent magnet lenses is treated, and means for varying the focal length of these lenses are described. The design aspects arising from the mutual interaction of the permanent magnet and its associated magnetic circuit are discussed: pole-piece systems, lens casing, and means of varying the focal length. In conclusion, the design of superconducting electron lenses is treated, starting with lenses featuring conventional ferromagnetic soft-iron pole pieces or rare-earth pole pieces fabricated from dysprosium or holmium. The particular requirements that arise when a lens is to be operated in the persistent current mode or when its field is charged by using a flux pump are explained. Finally, the design of the superconducting shielding lens is considered.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 39.99
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 54.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

References

  1. K. Akashi, M. Mashimo, H. Tochigi, H. Uchida, S. Shirai: In Proc. Tième Cong. Int. Microscopie Electronique, Grenoble 1970, ed. by P. Favard ( Société Française de Microscopie Electronique, Paris 1970 ) Vol. 1, pp. 143–144

    Google Scholar 

  2. G.D. Archard: J. Sci. Instrum. 30, 352–358 (1953)

    Article  ADS  Google Scholar 

  3. M. von Ardenne: Kolloid Z. 108, 195–208 (1944)

    Google Scholar 

  4. A. Asmus, K.-H. Herrmann, O. Wolff: Siemens Z. 42, 609–619 (1968)

    Google Scholar 

  5. ASTM Technical Standard A 342–364 (1976)

    Google Scholar 

  6. J.L. Balladore: “Propriétés et applications des lentilles électroniques à enroulement supraconducteur”; Thèse, Toulouse (1972)

    Google Scholar 

  7. G. Balossier, A. Laberrigue, D. Génotel, J.C. Homo: In Proc. 6th European Cong. Electron Microscopy,Jerusalem 1976, ed. by D.G. Brandon ( Tal International, Jerusalem 1976 ) Vol. 1, pp. 338–339

    Google Scholar 

  8. M. Bauer: J. Sci. Instrum. (J. Physics E) Ser. 2, 1, 1081–1089 (1968)

    Article  ADS  Google Scholar 

  9. H.J. Beier: Z. Angew. Phys. 23, 344–349 (1967)

    Google Scholar 

  10. F. Bertein: C.R. Acad. Sci. Paris 225, 801–805 (1947)

    MathSciNet  Google Scholar 

  11. F. Bertein: Ann. Radioélectr. 3, 49–62 (1948)

    Google Scholar 

  12. H. Boersch, O. Bostanjoglo, B. Lischke: Optik 24, 460–465 (1966/1967)

    Google Scholar 

  13. G. Bogner, C. Albrecht, R. Maier, C.P. Parsch: Proc. 2nd Int. Cryogenic Engineering Conf. (ICEC2), Brighton 1968 (Iliffe Science and Technology Publications, Guildford, 1968 ) pp. 175–178

    Google Scholar 

  14. P. Bonjour, A. Septier: C.R. Acad. Sci. Paris, B 264, 747–750 (1967)

    Google Scholar 

  15. P. Bonjour, A. Septier: In Proc. 4th European Regional Conf. Electron Microscopy, Rome, 1968, ed. by D.S. Bocciarelli ( Tipografia Poliglotta Vaticana, Rome 1968 ) Vol. 1, pp. 189–190

    Google Scholar 

  16. P. Bonjour: “Un nouveau type de lentille magnétique supraconductrice à pales d’holmium pour très haute tension”; Thèse, Orsay (1973)

    Google Scholar 

  17. P. Bonjour: In Proc. 8th Int. Cong. Electron Microscopy, Canberra, 1974, ed. by J.V. Sanders, D.J. Goodchild ( Australian Academy of Science, Canberra 1974 ) Vol. 1, 148–149

    Google Scholar 

  18. P. Bonjour: In Proc. 6th European Cong. Electron Microscopy, Jerusalem, 1976, ed. by D.G. Brandon ( Tal International, Jerusalem 1976 ) Vol. 1, pp. 73–78

    Google Scholar 

  19. B. von Borries, E. Ruska, J. Krumm, H.O. Müller: Naturwissenschaften 28, 350–351 (1940)

    Article  ADS  Google Scholar 

  20. 19a B. von Borries, E. Ruska: Siemens Z. 20, 217–227 (1940);

    Google Scholar 

  21. M. von Ardenne: Tabellen der Elektronenphysik, Ionenphysik und Ubermikroskopie (Deutscher Verlag der Wissenschaften, Berlin 1956) esp. Vol. 1, p. 407

    Google Scholar 

  22. B. von Borries: German Patents DRP S 153 465 (1942) and DBP 869 995 (19.10.1944)

    Google Scholar 

  23. B. von Borries, E. Ruska: DRP (German Patent) Nr. 923 616 (11. 10. 1944 )

    Google Scholar 

  24. B. von Borries: Die Ubermikroskopie (Verlag Dr. Werner Saenger, Berlin 1949 ) pp. 204–206

    Google Scholar 

  25. B. von Borries: Z. Wiss. Mikrosk. 60, 329–358 (1951)

    Google Scholar 

  26. B. von Borries, I. Johann, J. Hupperts, G. Langner, F. Lenz, W. Scheffels: “Die Entwicklung regelbarer permanentmagnetischer Elektronenlinsen hoher Brechkraft und eines mit ihnen ausgerüsteten Elektronenmikroskopes neuer Bauart”; Forschungsber. Wirtschafts-und Verkehrsministerium Nordrhein-Westfalen Nr. 156 ( Westdeutscher Verlag, Köln, Opladen 1956 )

    Google Scholar 

  27. H. Busch: Arch. Elektrotech. 18, 583–594 (1927);

    Article  Google Scholar 

  28. H. Busch: Ann. Phys. (Leipzig) 4, 81, 974–993 (1926)

    ADS  Google Scholar 

  29. J.R.A. Cleaver: Optik 49, 413–431 (1978)

    Google Scholar 

  30. J.R.A. Cleaver: Optik 57, 9–34 (1980)

    Google Scholar 

  31. J.R.A. Cleaver: Optik 58, 409–432 (1981)

    Google Scholar 

  32. V.E. Cosslett: Proc. 5th Int. Cong. High Voltage Electron Microscopy, Kyoto 1977, ed. by T. Imura, H. Hashimoto (Japanese Soc. of Electron Microscopy, Tokyo 1977 ) pp. 87–90

    Google Scholar 

  33. J.M. Cowley, A. Strojnik: In Proc. 27th Annual EMSA Meeting, St. Paul, Minn., 1969, ed. by C.J. Arceneaux ( Claitor, Baton Rouge, Louisiana 1969 ) pp. 106–107

    Google Scholar 

  34. I. Dietrich, R.G. Maier, R. Weyl, H. Zerbst: In Proc. 3rd Int. Cryogenics Engineering Conf. (ICEC III), Berlin 1968 ( Iliffe Science and Technology Publications, Guildford 1970 ) pp. 422–425

    Google Scholar 

  35. I. Dietrich, R. Weyl, H. Zerbst: In Proc. Tième Cong. Int. Microscopie Electronique, Grenoble, 1970, ed. by P. Favard ( Société Française de Microscopie Electronique, Paris 1970 ) Vol. II, pp. 101–102

    Google Scholar 

  36. I. Dietrich, G. Lefranc, R. Weyl, H. Zerbst: Optik 38, 449–453 (1973)

    Google Scholar 

  37. I. Dietrich, F. Fox, E. Knapek, G. Lefranc, K. Nachtrieb, R. Weyl, H. Zerbst: “Supraleitende Linsen für Höchstspannungsmikroskopie”; Forschungsber. T 75–44 of the Bundesministerium für Forschung und Technologie, Bonn (1975)

    Google Scholar 

  38. I. Dietrich, E. Knapek, R. Weyl, H. Zerbst: Cryogenics 15, 691–699 (1975)

    Article  Google Scholar 

  39. I. Dietrich: Superconducting Electron-Optic Devices (Plenum, New York, London 1976 )

    Google Scholar 

  40. I. Dietrich, F. Fox, E. Knapek, G. Lefranc, K. Nachtrieb, R. Weyl, H. Zerbst: Ultramicroscopy 2, 241–249 (1977)

    Article  Google Scholar 

  41. I. Dietrich: In Proc. 9th Int. Cong. Electron Microscopy, Toronto, 1978, ed. by J.M. Sturgess ( Microscopical Society of Canada, Toronto 1978 ) Vol. 1, pp. 173–184

    Google Scholar 

  42. A.C. van Dorsten, J.B. Le Poole: Philips Tech. Rev. 17, 47–59 (1955)

    Google Scholar 

  43. J. Dugas, P. Durandeau, Ch. Fert: Rev. Opt. 40, 277–305 (1961)

    Google Scholar 

  44. G. Dupouy, F. Perrier, L. Durrieu: J. Microsc. (Paris) 9, 575–592 (1970)

    Google Scholar 

  45. E. Durand: Magnétostatique ( Masson, Paris 1968 )

    Google Scholar 

  46. P. Durandeau, Ch. Fert: Rev. Opt. 36, 205–234 (1957)

    MathSciNet  Google Scholar 

  47. A. Edwards: “Magnet design and selection of materials”. In Permanent Magnets and Magnetism, ed. by D. Hadfield ( Iliffe Books, London 1962 ) pp. 191–296

    Google Scholar 

  48. A.B. El-Kareh, J.C.J. El-Kareh: Electron Beams, Lenses and Optics, 2 Vols. (Academic, New York, London 1970 )

    Google Scholar 

  49. J.F. Elliott, S. Legvold, F.H. Spedding: Phys. Rev. 94, 1143–1145 (1954)

    Article  ADS  Google Scholar 

  50. T. Etoh, S. Suzuki, H. Watanabe, T. Yanaka: In Proc. 8th Int. Cong. Electron Microscopy, Canberra, 1974, ed. by J.V. Sanders, D.J. Goodchild ( Australian Academy of Science, Canberra 1974 ) Vol. 1, pp. 174–175

    Google Scholar 

  51. H. Fahlenbrach, W. Baran: Dauermagnete und ihre Anwendung in Betrieben ( Carl Hauser Verlag, München 1965 )

    Google Scholar 

  52. H. Fahlenbrach: Fortschr. Ber. VDI-Z, Reihe 9, 6 ( VDI-Verlag, Düsseldorf 1968 )

    Google Scholar 

  53. J.S. Fahy, F.H. Plump, C.J. Rakels, M.N. Thompson: Philips Electron Optics Bulletin EM 110–1977/3, pp.6–13

    Google Scholar 

  54. J.L. Farrant: In Proc. Tième Cong. Int. Microscopie Electronique, Grenoble, 1970, ed. by P. Favard ( Société Françaisé de Microscopie Electronique, Paris 1970 ) Vol. 1, pp. 141–142

    Google Scholar 

  55. H. Fernandez-Moran: Proc. Natl. Acad. Sci. USA 53, 445–451 (1965)

    Article  ADS  Google Scholar 

  56. H. Fernandez-Moran: In Proc. 6th Int. Cong. Electron Microscopy, Kyoto, 1966, ed. by R. Uyeda ( Maruzen, Tokyo 1966 ) Vol. 1, pp. 147–148

    Google Scholar 

  57. H. Fernandez-Moran: In Proc. AMU-ANL Workshop on High Voltage Electron Microscopy, Argonne National Laboratory 1966 ( Clearinghouse for Federal Scientific and Technical Information, NBS, Springfield, VA 1966 ) pp. 51–58

    Google Scholar 

  58. J. Fischer: Abriss der Dauermagnetkunde (Springer, Berlin, Heidelberg 1949 )

    Google Scholar 

  59. M. Fotino: In Proc. 31st Annual EMSA Meeting, New Orleans, 1973, ed. by C.J. Arceneaux ( Claitor, Baton Rouge, Louisiana 1973 ) pp. 8–9

    Google Scholar 

  60. A. Gemperle, J. Novak, J. Kaczer: J. Phys. E 7, 518–520 (1974)

    Article  ADS  Google Scholar 

  61. D. Génotel, C. Séverin, A. Laberrigue: J. Microsc. (Paris) 6, 933–944 (1967)

    Google Scholar 

  62. D. Génotel, G. Balossier, C. Séverin, M. Girard, J.-C. Homo, A. Laberrigue: C.R. Acad. Sci. Paris, B 272, 1961–1964 (1971)

    Google Scholar 

  63. D. Génotel, G. Balossier: Rev. Phys. Appl. 10, 443–451 (1975)

    Article  Google Scholar 

  64. W. Glaser: Grundlagen der Elektronenoptik ( Springer, Wien 1952 )

    MATH  Google Scholar 

  65. M.E. Haine, R.S. Page, R.G. Garfitt: J. Appl. Phys. 21, 173–182 (1950)

    Article  ADS  Google Scholar 

  66. M.E. Haine, T. Mulvey: J. Sci. Instrum. 31, 326–332 (1954)

    Article  ADS  Google Scholar 

  67. J.J. Hanak: RCA Rev. 25, 551–569 (1964)

    Google Scholar 

  68. P.W. Hawkes: Quadrupole Optics, Erg. Exakt. Naturwiss, Vol. 42 ( Springer, Berlin, Heidelberg, New York 1966 )

    Google Scholar 

  69. P.W. Hawkes: J. Microsc. (Paris) 9, 435–454 (1970)

    Google Scholar 

  70. P.W. Hawkes: In Proc. Tième Cong. Int. Microscopie Electronique, Grenoble, 1970, ed. by P. Favard ( Société Française de Microscopie Electronique, Paris 1970 ) Vol. 2, pp. 17–18

    Google Scholar 

  71. P.W. Hawkes: Quadrupoles in Electron Lens Design (, New York, London 1970 )

    Google Scholar 

  72. P.W. Hawkes, U. Valdrè: J. Phys. E 10, 309–328 (1977)

    Article  ADS  Google Scholar 

  73. P.W. Hawkes: This volume, pp.1–56

    Google Scholar 

  74. H.G. Heide: Mikroskopie 24, 179–185 (1969)

    Google Scholar 

  75. H.G. Heide, K. Urban: J. Phys. E 5, 803–808 (1972)

    Article  ADS  Google Scholar 

  76. W.E. Henry: J. Phys. Rad. 20, 192–194 (1954)

    Article  Google Scholar 

  77. K.-H. Herrmann, K. Ihmann, D. Krahl: In Proc. 8th Int. Cong. Electron Microscopy, Canberra, 1974, ed. by J.V. Sanders, D.J. Goodchild ( Australian Academy of Science, Canberra 1974 ) Vol. 1, pp. 132–133

    Google Scholar 

  78. M.B. Hesse: Proc. Phys. Soc. (London) B 63, 386–401 (1950)

    Article  ADS  Google Scholar 

  79. M. Hibino, D. Hardy, D.F. Plomp, F.H. Kawakatsu, B.M. Siegel: J. Appl. Phys. 44, 4743–4748 (1973)

    Article  ADS  Google Scholar 

  80. H.-J. Hildebrandt: “Zur Dimensionierung des Eisenkreises elektromagnetischer Elektronenlinsen”; Diploma-Thesis, Free University of Berlin (1954)

    Google Scholar 

  81. H.-J. Hildebrandt, W.D. Riecke: Z. Angew. Phys. 20, 336–342 (1966)

    Google Scholar 

  82. J. Hillier: J. Appl. Phys. 17, 307–309 (1946)

    Article  ADS  Google Scholar 

  83. J. Hillier: J. Appl. Phys. 17, 411–419 (1946)

    Article  ADS  Google Scholar 

  84. J. Hillier, E.G. Ramberg: J. Appl. Phys. 18, 48–71 (1947)

    Article  ADS  Google Scholar 

  85. J. Hopkinson, E. Hopkinson: Phil. Trans. Roy. Soc. London 177, 331–358 (1886)

    Article  Google Scholar 

  86. E.M. Hörl: In Proc. 8th Int. Cong. Electron Microscopy, Canberra, 1974, ed. by J.V. Sanders, D.J. Goodchild ( Australian Academy of Science, Canberra 1974 ) Vol. 1, pp. 170–171

    Google Scholar 

  87. Y. Ishikawa, S. Chikazumi: Jpn. J. Appl. Phys. 1, 155–173 (1962)

    Article  ADS  Google Scholar 

  88. J.D. Jackson: Classical Electrodynamicws ( Wiley, New York 1975 ) pp. 54–55

    MATH  Google Scholar 

  89. H. Kaden: Wirbelströme und Schirmung in der elektrischen Nachrichtentechnik. Technische Physik in Einzeldarstellungen, Band 10 ( Springer, Berlin, Heidelberg, New York 1959 )

    Google Scholar 

  90. W. Kanminga, J.L. Verster, J.C. Francken: Optik 28, 442–461 (1968/1969)

    Google Scholar 

  91. W. Kamminga:“The numerical investigation of some electron optical designs”. Doctoral Thesis, Groningen (1976);

    Google Scholar 

  92. W. Kamminga: Optik 45, 39–54 (1976)

    Google Scholar 

  93. E. Kasper: This volume, pp.57–118

    Google Scholar 

  94. S. Katagiri: 19th Meeting of the Japanese Electron Microscopy Soc., A-3, (1963)

    Google Scholar 

  95. H.-J. Kempin, K.-H. Müller, M.v. Rauch, N. Schäfer, K. Vollborn: Beitr. Elektronenmikroskop. Direktabb. Oberfl. 8, 339–346 (1975)

    Google Scholar 

  96. H. Kimura, T. Fujioka: Hitachi Hyoron 36, 1517–1526 (1954)

    Google Scholar 

  97. H. Kimura, Y. Kikuchi: J. Electron Microsc. (Japan) 7, 1–4 (1959)

    Google Scholar 

  98. E. Kinder, A. Pendzich: Jahrb. AEG-Forsch. 7, 23–26 (1940)

    Google Scholar 

  99. E. Kinder: Z. Phys. 122, 192–208 (1944)

    Article  ADS  Google Scholar 

  100. J. Koch, K. Ruschmeyer: Permanentmagnete I, Grundlagen (Hrs. Valvo, Hamburg 1967 )

    Google Scholar 

  101. M. Kubozoe, T. Kimura, S. Ozasa, S. Kasai: In Proc. zieme Congrès Int. Microscopie Electronique, Grenoble, 1970, ed. by P. Favard ( Société Française de Microscopie Electronique, Paris 1970 ) Vol. II, pp. 47–48

    Google Scholar 

  102. W. Kunath, W.D. Riecke, E. Ruska: In Proc. 6th Int. Cong. Electron Microscopy, Kyoto, 1966, ed. by R. Uyeda ( Maruzen, Tokyo 1966 ) Vol. 1, pp. 139–140

    Google Scholar 

  103. A. Laberrigue, P. Levinson, J.-C. Homo: Rev. Phys. Appl. 6, 453–458 (1971)

    Article  Google Scholar 

  104. A. Laberrigue, D. Génotel, M. Girard, C. Séverin, G. Balossier, J.-C. Homo: In Proc. 3rd Int. Conf. High Voltage Electron Microscopy, Oxford, 1973, ed. by P.R. Swann, C.J. Humphreys, M.J. Goringe ( Academic, London, New York 1974 ) pp. 108–113

    Google Scholar 

  105. A. Laberrigue, G. Berjot, P. Bonhomme, D. Génotel, M. Girard, J.-C. Homo, C. Séverin: In Proc. 8th Int. Cong. Electron Microscopy, Canberra, 1974, ed. by J.V. Sanders, D.J. Goodchild ( Australian Academy of Science, Canberra 1974 ) Vol. 1, pp. 144–145

    Google Scholar 

  106. H.L. Laquer: Cryogenics 3, 27–30 (1963)

    Article  Google Scholar 

  107. K.R. Lawless, R.H. Geiss: In Proc. 27th Annual EMSA Meeting, St. Paul, Minn., 1969, ed. by C.J. Arceneaux ( Claitor, Baton Rouge, Louisiana 1969 ) pp. 94–95

    Google Scholar 

  108. S. Leisegang: Optik 10, 5–14 (1953)

    Google Scholar 

  109. S. Leisegang: Optik 11, 49–60 (1954)

    Google Scholar 

  110. F. Lenz: This volume, pp.119–161

    Google Scholar 

  111. J.B. Le Poole: Philips Tech. Rundsch. 9, 33–46 (1947)

    Google Scholar 

  112. J.B. Le Poole: In Proc. 3rd European Reg. Conf. Electron Microscopy, Prague, 1964, ed. by M. Titlbach (Czechoslovak Academy of Sciences, Prague 1964) Appendix, p.6

    Google Scholar 

  113. P. Levinson, A. Laberrigue, O. Testard: Cryogenics 5, 344–346 (1965)

    Article  Google Scholar 

  114. G. Liebmann, E.M. Grad: Proc. Phys. Soc. London B64, 956–971 (1951)

    Article  ADS  Google Scholar 

  115. G. Liebmann: Proc. Phys. Soc. London B64, 972–977 (1951)

    Article  ADS  Google Scholar 

  116. G. Liebmann: Proc. Phys. Soc. London B65, 94–107 (1952)

    ADS  Google Scholar 

  117. G. Liebmann: Proc. Phys. Soc. London B66, 448–458 (1953)

    Article  ADS  Google Scholar 

  118. G. Liebmann: Proc. Phys. Soc. London B68, 679–681 (1955)

    Article  ADS  Google Scholar 

  119. G. Liebmann: Proc. Phys. Soc. London B68, 737–745 (1955)

    Article  ADS  Google Scholar 

  120. B. Lischke, W. Münchmeyer: Optik 50, 315–328 (1978)

    Google Scholar 

  121. J.J. Lopez: In Proc. Tième Cong. Int. Microscopie Electronique à Haute Tension, Toulouse, 1975, ed. by B. Jouffrey, P. Favard ( Société Française de Microscopie Electronique, Paris 1976 ) pp. 43–46

    Google Scholar 

  122. N.C. Lund: In Proc. 25th Annual EMSA Meeting, Chicago, 1967, ed. By C.J. Arceneaux ( Claitor, Baton Rouge, Louisiana 1967 ) pp. 228–229

    Google Scholar 

  123. A. Mager: Z. Angew. Phys. 23, 381–386 (1967)

    Google Scholar 

  124. A. Mager: Frequenz 22, 25–27 (1968)

    Article  Google Scholar 

  125. L.A. Marzetta: Rev. Sci. Instrum. 32, 1192–1195 (1961)

    Article  ADS  Google Scholar 

  126. M. McCaig: Permanent Magnets in Theory and Practice(Pentech, London, Plymouth 1977 )

    Google Scholar 

  127. G. Möllenstedt: J. Microsc. (Paris) 4, 413–428 (1965)

    Google Scholar 

  128. K. Müller, E. Ruska: Z. Wiss. Mikrosk. 62, 205–219 (1955)

    Google Scholar 

  129. K. Müller: Z. Wiss. Mikrosk. 63, 303–328 (1957)

    Google Scholar 

  130. K. Müller, E. Ruska: In Vierter Int. Kong. Elektronenmikroskopie, Berlin,1958, ed. by W. Bargmann, G. Möllenstedt, H. Niehrs, D. Peters, E. Ruska, C. Wolpers (Springer, Berlin, Heidelberg, Berlin, 1960 ) Vol. 1, pp. 184–187

    Google Scholar 

  131. K. Müller, E. Ruska: Mikroskopie 23, 197–219 (1968)

    Google Scholar 

  132. K. Müller, E. Ruska, H. Neff: In Proc. 27th Annual EMSA Meeting, St. Paul, Minn., 1969, ed. by C.J. Arceneaux ( Claitor, Baton Rouge, Louisiana 1969 ) pp. 74–75

    Google Scholar 

  133. K.H. Müller, R. Schliepe: Siemens Z. 47, 471–475 (1973)

    Google Scholar 

  134. T. Mulvey: Proc. Phys. Soc. London B66, 441–447 (1953)

    Article  ADS  Google Scholar 

  135. T. Mulvey, N.J. Wallington: J. Sci. Instrum. (J. Phys. E) Ser. 2, 2, 466–472 (1969)

    Article  ADS  Google Scholar 

  136. T. Mulvey: In Proc. 25th Anniversary Meeting EMAG, Cambridge, 1971, ed. by W.C. Nixon ( Institute of Physics, London 1971 ) pp. 77–83

    Google Scholar 

  137. T. Mulvey, C.D. Newman: In Proc. 5th European Cong. Electron Microscopy, Manchester, 1972 ( Institute of Physics, London 1972 ) pp. 116–117

    Google Scholar 

  138. T. Mulvey, C.D. Newman: In Scanning Electron Microscopy; Systems and Applications 1973, ed. by W.C. Nixon ( Institute of Physics, London 1973 ) pp. 16–21

    Google Scholar 

  139. T. Mulvey, C.D. Newman: In Proc. 3rd Int. Conf. High Voltage Electron Microscopy, Oxford 1973, ed. by P.R. Swann, C.J. Humphreys, M.J. Goringe ( Academic, London, New York 1974 ) pp. 98–102

    Google Scholar 

  140. T. Mulvey: In Proc. 8th Int. Cong. Electron Microscopy, Canberra, 1974, ed. by J.V. Sanders, D.J. Goodchild ( Australian Academy of Science, Canberra 1974 ) Vol. 1, pp. 16–17

    Google Scholar 

  141. T. Mulvey: This volume, pp.359–412

    Google Scholar 

  142. E. Munro: “Computer-Aided Design Methods in Electron Optics”; Ph. D. Thesis, Cambridge (1971)

    Google Scholar 

  143. E. Munro: In Image Processing and Computer-Aided Design in Electron Optics, ed. by P.W. Hawkes ( Academic, London, New York, 1973 ) pp. 284–323

    Google Scholar 

  144. S. Ozasa, S. Katagiri: J. Electron Microsc. (Japan) 12, 110 (1963)

    Google Scholar 

  145. R.S. Page: In Electron Microscopy 1964. Proc. 3rd European Regional Conf., Prague, 1964, ed. by M. Titlbach ( Czechoslovak Academy of Sciences, Prague 1964 ) Vol. 1, pp. 31–32

    Google Scholar 

  146. K. Pape: “Die Abbildungseigenschaften des Vorfeldes magnetischer Elektronenlinsen”; Diploma Thesis, Berlin (1966)

    Google Scholar 

  147. R.J. Parker, R.J. Studders: Permanent Magnets and Their Applications ( Wiley, New York 1962 )

    Google Scholar 

  148. W. Pejas: Optik 50, 61–72 (1978)

    Google Scholar 

  149. K.G. Petzinger, J.J. Hanak: RCA Rev. 25, 542–550 (1964)

    Google Scholar 

  150. C.J. Rakels, J. van Helden, W. Kuypers, J.C. Tiemeyer: In Proc. Tième Cong. Microscopie Electronique, Grenoble, 1970, ed. by P. Favard ( Société Française de Microscopie Electronique, Paris 1970 ) Vol. II, pp. 53–54

    Google Scholar 

  151. E.G. Ramberg: US Patent No. 2 369 796 (1943)

    Google Scholar 

  152. O. Rang: Optik 5, 518–530 (1949)

    Google Scholar 

  153. A. Recknagel. G. Haufe: Wiss. Z. Techn. Hochsch. Dresden 2, 1–10 (1952/1953)

    Google Scholar 

  154. J.H. Reisner, E.G. Dornfeld: J. Appl. Phys. 21, 1131–1139 (1950)

    Article  ADS  Google Scholar 

  155. J.H. Reisner: J. Appl. Phys. 22, 561–565 (1951)

    Article  ADS  Google Scholar 

  156. J.H. Reisner, S.M. Zollers: Electronics 24, No. 1, 86–91 (1951)

    Google Scholar 

  157. J.H. Reisner, J.J. Schuler: In Proc. 25th Annual EMSA Meeting, Chicago, 1967, ed. by C.J. Arceneaux ( Claitor, Baton Rouge, Louisiana 1967 ) pp. 226–227

    Google Scholar 

  158. B.L. Rhodes, S. Legvold, F.H. Spedding: Phys. Rev. 109, 1547–1550 (1958)

    Article  ADS  Google Scholar 

  159. W.D. Riecke, E. Ruska: German Patent DBP 1033 818 (1954)

    Google Scholar 

  160. W.D. Riecke, E. Ruska: Z. Wiss. Mikrosk. 63, 288–302 (1957)

    Google Scholar 

  161. W.D. Riecke: In Vierter Int. Kong. Elektronenmikroskopie, Berlin 1958, ed. By W. Bargmann, G. Möllenstedt, H. Niehrs, D. Peters, E. Ruska, C. Wolpers (Springer, Berlin, Heidelberg, Berlin, 1960 ) Vol. I, pp. 189–194

    Google Scholar 

  162. W.D. Riecke: In Proc. European Regional Conf. Electron Microscopy, Delft, 1960, ed. by A.L. Houwink, B.J. Spit (Nederlandse Vereiniging voor Electronenmicroscopie, Delft, no date) Vol. 1, pp. 82–88

    Google Scholar 

  163. W.D. Riecke: Optik 18, 379–401 (1961)

    Google Scholar 

  164. W.D. Riecke: Optik 19, 81–116 (1962)

    Google Scholar 

  165. W.D. Riecke: Optik 19, 169–183, 193–207 (1962)

    Google Scholar 

  166. W.D. Riecke: Optik 19, 273–286 (1962)

    Google Scholar 

  167. W.D. Riecke: In Proc. 5th Int. Cong. Electron Microscopy, Philadelphia, 1962, ed. by S.S. Breese (Academic, New York, London 1962) Vol.1, pp.KK-5

    Google Scholar 

  168. W.D. Riecke, E. Ruska: In Proc. 6th Int. Cong. Electron Microscopy, Kyoto, 1966, ed. by R. Uyeda ( Maruzen, Tokyo 1966 ) Vol. 1, pp. 19–20

    Google Scholar 

  169. W.D. Riecke: Optik 24, 397–426 (1966/1967)

    Google Scholar 

  170. W.D. Riecke: US Patent 3 560 781 (filed 27.6.1967, patented 2.2.1972) German Patent DBP 1 614 123 (24.2. 1967 )

    Google Scholar 

  171. W.D. Riecke: US-Patent 3 526 766 (filed 27.7.1967, patented 1. 7. 1970 )

    Google Scholar 

  172. W.D. Riecke: German Patent DBP 1614163 (1967)

    Google Scholar 

  173. W.D. Riecke, F. Stöcklein: German Patent DBP 1 614 165 (1967)

    Google Scholar 

  174. W.D. Riecke, F. Stöcklein: German Patent DBP 1 300 992 (1967)

    Google Scholar 

  175. W.D. Riecke: In Proc. 4th European Regional Conf. Electron Microscopy, Rome, 1968, ed. by D.S. Bocciarelli (Tipographia Poliglotta Vaticana, Rome 1968), Vol.1, pp.207–208

    Google Scholar 

  176. W.D. Riecke: Z. Angew. Physik 27, 155–165 (1969)

    Google Scholar 

  177. W.D. Riecke: Optik 36, 66–84, 288–308, 375–398 (1972)

    Google Scholar 

  178. W.D. Riecke: “Die Physik der magnetischen Elektronenlinse I. Der Aufbau des Polschuhsystems der konventionellen magnetischen Elektronenlinse”, Lectures held at the University of Tübingen (1973/1974); lecture notes available from Institut für Angewandte Physik der Universität Tübingen 4.167 W.D. Riecke: “Quadrupol-Elektronenlinsen”. Lectures at the University of Tübingen (1975)

    Google Scholar 

  179. W.D. Riecke: 17. Tagung der Deutschen Gesellschaft für Elektronenmikroskopie, Berlin 1975; abstracts: contribution J 12 ( Programme of the Meeting published by Deutsche Gesellschaft für Elektronenmikroskopie, Berlin 1975 ) pp. 41–42

    Google Scholar 

  180. W.D. Riecke: In Proc. Tième Cong. Int. Microscopie Electronique à Haute Tension, Toulouse, 1975, ed. by B. Jouffrey, P. Favard ( Société Française de Microscopie Electronique, Paris 1976 ) pp. 39–42

    Google Scholar 

  181. W.D. Riecke: In Electron Microscopy in Materials Science, ed. by U. Valdrè, E. Ruedl (Commission of the European Communities, Luxemburg 1975 ) Vol. 1, pp. 21–50

    Google Scholar 

  182. W.D. Riecke: In Electron Microscopy in Materials Science, ed. by U. Valdrè, E. Ruedl (Commission of the European Communities, Luxemburg, 1975 ) Vol. 1, pp. 51–79

    Google Scholar 

  183. W.D. Riecke: In Electron Microscopy in Materials Science, ed. by U. Valdrè, E. Ruedl (Commission of the European Communities, Luxemburg 1975 ) Vol. 1, pp. 81–111

    Google Scholar 

  184. W.D. Riecke: In Proc. 5th Int. Conf. High Voltage Electron Microscopy, Kyoto, 1977, ed. by T. Imura, H. Hashimoto (Japanese Soc. of Electron Microscopy, Tokyo 1977 ) pp. 73–78

    Google Scholar 

  185. J.W. Rommerts: German Patent DBP 1 078 703 (1958), US-Patent 2 939 955 (filed 4.3.1958; patented 7. 6. 1960 )

    Google Scholar 

  186. E. Ruska: Z. Phys. 87, 580–602 (1934)

    Article  ADS  Google Scholar 

  187. E. Ruska: “Grundlagen der Elektronenoptik und ihre Anwendungen bei modernen Elektronenmikroskopen”, in Convegno di Elettronica e Televisione, Milan 1954; session 4, general lecture to the third section. La Ricerca Scientifica Suppl. 3–30 (1954)

    Google Scholar 

  188. E. Ruska: Arch. Elektrotech. 38, 102–130 (1944)

    Article  Google Scholar 

  189. E. Ruska: Kolloid Z. 107, 2–16 (1944)

    Article  Google Scholar 

  190. E. Ruska: Kolloid Z. 115, 102–120 (1950)

    Article  Google Scholar 

  191. E. Ruska: Z. Wiss. Mikrosk. 61, 152–171 (1952)

    Google Scholar 

  192. E. Ruska: In Electron Physics (National Bureau of Standards Circular 527, Washington 1954 ) pp. 389–410

    Google Scholar 

  193. E. Ruska: In Les Techniques Récentes en Microscopie Electronique et Corpusculaire ( C.N.R.S., Paris 1956 ). pp. 253–260

    Google Scholar 

  194. E. Ruska, O. Wolff: Z. Wiss. Mikrosk. 62, 465–509 (1956)

    Google Scholar 

  195. E. Ruska: J. Roy. Microsc. Soc. 84, 77–103 (1965)

    Article  Google Scholar 

  196. E. Ruska: In Proc. 8th Int. Cong. Electron Microscopy, Canberra, 1974, ed. by J.V. Sanders, D.J. Goodchild ( Australian Academy of Sciences, Canberra 1974 ) Vol. 1, pp. 24–25

    Google Scholar 

  197. Y. Sakitani, S. Ozasa, H. Fujita, K. Ohji: In Proc. Tième Cong. Int. Microscopie Electronique, Grenoble, 1970, ed. by P. Favard ( Société Française de Microscopie Electronqiue, Paris 1970 ) Vol. 1, pp. 127–128

    Google Scholar 

  198. O. Scherzer: J. Appl, Phys. 20, 20–28 (1949)

    Article  MATH  ADS  Google Scholar 

  199. K. Schüler, K. Brinkmann: Dauermagnete, Werkstoffe und Anwendungen (Springer, Berlin, Heidelberg, New York 1970 )

    Google Scholar 

  200. A. Septier, P. Bonjour: Phys. Bull. 24, 433–434 (1973)

    Google Scholar 

  201. C. Séverin, D. Génotel, M. Girard, A. Laberrigue: Rev. Phys. Appl. 6, 459–465 (1971)

    Article  Google Scholar 

  202. B.M. Siegel, N. Kitamura, R.A. Kropfli, M.P. Schulhof: In Proc. 6th Int. Cong. Electron Microscopy, Kyoto, 1966, ed. by R. Uyeda ( Maruzen, Tokyo 1966 ) Vol. 1, pp. 151–152

    Google Scholar 

  203. B.M. Siegel, D.L. Musinski, Huei Pei Kuo: In Proc. 8th Int. Cong. Electron Microscopy, Canberra, 1974, ed. by J.V. Sanders, D.J. Goodchild ( Australian Academy of Science, Canberra 1974 ) Vol. 1, pp. 26–27

    Google Scholar 

  204. B.M. Siegel: In Proc. 6th Eur. Cong. Electron Microscopy, Jerusalem, 1976, ed. by D.G. Brandon ( Tal International, Jerusalem 1976 ) Vol. 1, pp. 105–108

    Google Scholar 

  205. B.M. Siegel, M. Shimoyama, E. van der Leeden: In Proc. 9th Int. Cong. Electron Microscopy, Toronto, 1978, ed. by J.M. Sturgess ( Microscopical Society of Canada, Toronto 1978 ) Vol. 1, pp. 8–9

    Google Scholar 

  206. F. Stöcklein: German Patent DBP 1286239 (1967) and US Patent 3474247 (1967)

    Google Scholar 

  207. D.L. Strandburg, S. Legvold, F.H. Spedding: Phys. Rev. 127, 2046–2051 (1962)

    Article  ADS  Google Scholar 

  208. A. Strojnik: In Proc. 27th Annual EMSA Meeting, St. Paul, Minn., 1969, ed. By C.J. Arceneaux ( Claitor, Baton Rouge, Louisiana 1969 ) pp. 104–105

    Google Scholar 

  209. S. Suzuki: US Patent No. 3 173 005 (1965)

    Google Scholar 

  210. S. Suzuki, K. Akashi, H. Tochigi: In Proc. 26th Annual EMSA Meeting, New Orleans, La., 1968, ed. by C.J. Arceneaux ( Claitor, Baton Rouge, Louisiana 1968 ) pp. 320–321

    Google Scholar 

  211. B. Tadano, Y. Onuma: Hitachi Rev. 1954 (July) pp.89–102

    Google Scholar 

  212. B. Tadano, I. Makino: Hitachi Electron Microscope, Type HU-10 (Hitachi Ltd. Tech. Manual 1958 ) pp. 1–24

    Google Scholar 

  213. B. Tadano, H. Kimura, Y. Onuma: Hitachi Rev. 15, 340–344 (1966)

    Google Scholar 

  214. R.S. Tebble, D.J. Craik: Magnetic Materials ( Wiley Interscience, New York 1969 )

    Google Scholar 

  215. H. Teuchert: Elektrotechnik 2, 353–355 (1948)

    Google Scholar 

  216. Sir William Thomson (Lord Kelvin): Reprints of Papers on Electrostatics and Magnetism (MacMillan, London 1872) esp. p.564

    Google Scholar 

  217. F. Thon: “Zur Deutung der Bildstrukturen in hochaufgelösten elektronenmikroskopischen Aufnahmen dünner amorpher Objekte”; Dissertation Dr. Naturwiss., Tübingen (1968)

    Google Scholar 

  218. U. Valdrè: In Electron Microscopy in Materials Science, ed. by U. Valdrè, E. Ruedl (Commission of the European Communities, Luxemburg 1975 ) Vol. 1, pp. 115–134

    Google Scholar 

  219. M. Watanabe, T. Someya: Optik 20, 99–108 (1963)

    Google Scholar 

  220. M. Watanabe, T. Yanaka, M. Yamamoto, S. Suzuki, Y. Nagahama, U. Fujisawa: In Proc. 4th European Regional Conf. Electron Microscopy, Rome 1968, ed. By D.S. Bocciarelli (Tipografia Poliglotta Vaticana, By D.S. 1968 ) Vol. 1, pp. 203–204

    Google Scholar 

  221. R.C. Weast, M.J. Astle (eds.): CRC Handbook of Chemistry and Physics (CRC Press Inc., Palm Beach, Florida 1978/1979)

    Google Scholar 

  222. L. Wegmann: Optik 11, 153–170 (1954)

    Google Scholar 

  223. P. Weiss: J. Phys. 4, 6, 353–368 (1907)

    Google Scholar 

  224. J.J. Went, G.W. Rathenau, E.W. Gorter, G.W. van Oosterhout: Philips’ Techn. Rundschau 13, 361–376 (1952)

    Google Scholar 

  225. D. Willasch: Siemens Analytical Application Note No. 212 (1976)

    Google Scholar 

  226. D. Willasch: In Proc. Vol.? Electron Microscopy Society of Southern Africa, Kaapstad, 1977 ( Electron Microscopy Soc. of Southern Africa, Kaapstad 1977 ) pp. 5–6

    Google Scholar 

  227. R.E. Worsham, J.E. Mann: In Proc. 6th Eur. Cong. Electron Microscopy, Jerusalem, 1976, ed. by D.G. Brandon ( Tal International, Jerusalem 1976 ) Vol. 1, pp. 358–359

    Google Scholar 

  228. R.E. Worsham, J.E. Mann, E.G. Richardson, N.F. Ziegler: In Proc. 28th Annual EMSA Meeting, Houston, 1970, ed. by C.J. Arceneaux ( Claitor, Baton Rouge, Louisiana 1970 ) pp. 354–355

    Google Scholar 

  229. K. Yada, H. Kawakatsu: J. Electron Microsc. (Japan) 25, 1–9 (1976)

    Google Scholar 

  230. F. Zemlin: “Magnetischer Fluß and magnetische Feldstärke in magnetisch übersättigten Polschuhsystemen”; Diploma Thesis, Free University of Berlin (1967)

    Google Scholar 

Download references

Authors

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 1982 Springer-Verlag Berlin Heidelberg

About this chapter

Cite this chapter

Riecke, W.D. (1982). Practical Lens Design. In: Hawkes, P.W. (eds) Magnetic Electron Lenses. Topics in Current Physics, vol 18. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-81516-4_4

Download citation

  • DOI: https://doi.org/10.1007/978-3-642-81516-4_4

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-81518-8

  • Online ISBN: 978-3-642-81516-4

  • eBook Packages: Springer Book Archive

Publish with us

Policies and ethics