Abstract
Many electron microscopists are familiar with the analysis of electron micrographs by using optical diffraction [5.1]. The optical diffractogram, which is essentially the absolute square of the Fourier transform of the optical density on the plate, reveals information on periodicities [5.2], astigmatism, defocus [5.3], drift [5.4] illumination [5.5–7] and defocus spread [5.8].
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Frank, J. (1980). The Role of Correlation Techniques in Computer Image Processing. In: Hawkes, P.W. (eds) Computer Processing of Electron Microscope Images. Topics in Current Physics, vol 13. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-81381-8_5
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