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Computer Processing of Electron Microscope Images pp 127–185Cite as

Three-Dimensional Structure Determination by Electron Microscopy (Nonperiodic Specimens)

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Part of the book series: Topics in Current Physics ((TCPHY,volume 13))

Abstract

The three-dimensional reconstruction of individual molecules from a set of electron micrographs is comparable to the “reconstruction” of structures in X-ray crystallography. Basically the electron microscope is equivalent to a diffractometer, since the specimen is illuminated by a parallel primary beam with a well-defined wavelength and orientation. The Fourier inversion of an electron micrograph delivers the distorted structure factors in a well-defined plane or weakly curved surface of the three-dimensional reciprocal space. Extraction of the undistorted structure factors and reconstruction is possible if a sufficient number of micrographs with different orientations of the object is available. Structure factors within a certain resolution in reciprocal space must be known to give a well defined reconstruction. Unlike X-ray crystallography, no “phase problem” exists since the phases of the structure factors can be deduced from the micrographs.

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Authors
  1. W. Hoppe
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  2. R. Hegerl
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Editor information

Editors and Affiliations

  1. Laboratoire d’Optique Electronique du CNRS, Toulouse Cedex, B. P. 4347, F-31055, France

    Peter W. Hawkes M. A., Ph. D.

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Hoppe, W., Hegerl, R. (1980). Three-Dimensional Structure Determination by Electron Microscopy (Nonperiodic Specimens). In: Hawkes, P.W. (eds) Computer Processing of Electron Microscope Images. Topics in Current Physics, vol 13. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-81381-8_4

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  • DOI: https://doi.org/10.1007/978-3-642-81381-8_4

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-81383-2

  • Online ISBN: 978-3-642-81381-8

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