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Implantation of Bi into GaP III. Hot-Implant Behavior

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Ion Implantation in Semiconductors

Abstract

Channeling and photoluminescence are studied in GaP implanted with Bi at an elevated temperature (450°C), and comparison is made with samples implanted at room temperature (25°C) and subsequently annealed at 450 °C. It is found that the channeling behavior is significantly improved by the hot implant, and that the Bi is ~75% substitutional. However, no photoluminescence is observable unless the samples are annealed at temperatures in excess of 600 °C. After annealing at 800 °C, the luminescence intensity obtained from the hot-implant samples is compared with those implanted at room temperature, for doses of 2 · 1013 and 1.8-1015 Bi ions/cm2. For the low-dose case, hot implants increase the luminescence by only ~8%, whereas the weak luminescence observed from the high-dose samples increases by ~65%. The spectral features of the luminescence provide evidence for the presence of both strain and competing damage centers. A detailed study of the channeling angular distribution indicates that the low optical efficiencies cannot be explained by assuming that a substantial fraction of the implanted Bi ions occupy substitutional Ga sites, where they would be optically inactive.

On leave from University of the Witwatersrand, Johannesburg, South Africa.

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References

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Ingolf Ruge (Professor an der Technischen Universität München)Jürgen Graul (Wissenschaftlicher Mitarbeiter am Institut für Technische Elektronik der Technischen Universität München)

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© 1971 Springer-Verlag, Berlin · Heidelberg

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Merz, J.L., Feldman, L.C., Mingay, D.W., Augustyniak, W.M. (1971). Implantation of Bi into GaP III. Hot-Implant Behavior. In: Ruge, I., Graul, J. (eds) Ion Implantation in Semiconductors. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-80660-5_25

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  • DOI: https://doi.org/10.1007/978-3-642-80660-5_25

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-80662-9

  • Online ISBN: 978-3-642-80660-5

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