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Ultrafast Surface Reaction and Desorption Probed by Femtosecond Second Harmonic Generation: Cl Etching of Si(111) Surface

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Part of the book series: Springer Series in Chemical Physics ((CHEMICAL,volume 62))

Abstract

In order to establish a new maicrofabrication of semiconductors, we need to clarify the mechanisms of reaction between material surfaces and reactive species. Especially, the dry etching process on Si surface is the most spreading process in the electronics applications and has been extensively studied [1]. The optical second harmonic generation is also a powerful technique to study surface science because of its surface sensitivity, non-detrimental and in-situ observation, and the ultrafast response [2]. Femtosecond time-resolved studies of the desorption and/or reaction on the metal or semiconductor surfaces have been carried out [3,4]. In this letter we report the results of the laser-induced surface reaction and/or desorption on the Si(111)/Cl2 system by using the femtosecond second harmonic generation.

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Reference

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© 1996 Springer-Verlag Berlin Heidelberg

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Sasaki, F., Haraichi, S., Kobayashi, S., Tani, T., Komuro, M. (1996). Ultrafast Surface Reaction and Desorption Probed by Femtosecond Second Harmonic Generation: Cl Etching of Si(111) Surface. In: Barbara, P.F., Fujimoto, J.G., Knox, W.H., Zinth, W. (eds) Ultrafast Phenomena X. Springer Series in Chemical Physics, vol 62. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-80314-7_199

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  • DOI: https://doi.org/10.1007/978-3-642-80314-7_199

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-80316-1

  • Online ISBN: 978-3-642-80314-7

  • eBook Packages: Springer Book Archive

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