Abstract
The temperature is a crucial factor in the damaging of components, exposed to ESD-transients. A way to study the influence of the temperature is to simulate mathematically the behavior of components, when stressed by electrical transients.
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© 1998 Springer-Verlag Berlin Heidelberg
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Hellström, S. (1998). Simulation methods. In: ESD — The Scourge of Electronics. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-80302-4_10
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DOI: https://doi.org/10.1007/978-3-642-80302-4_10
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-80304-8
Online ISBN: 978-3-642-80302-4
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