Abstract
In the past few years, a quantitative comparison between experimental data and theoretical calculations has been in the focus of advanced research based on Scanning Probe Methods (SPM). Of particular interest has been the interpretation of Scanning Tunneling Spectroscopy (STS) data, the explanation of large corrugation amplitudes in Scanning Tunneling Microscopy (STM), the investigation of the role of forces in STM, and the study of atom transfer processes between tip and sample. In the field of Scanning Force Microscopy (SFM), a major effort has been placed on measurements and calculations of long-range forces, in particular Van der Waals (VdW) forces, and on their exploitation for high-resolution non-destructive surface profiling. This chapter will provide an overview of the most recent developments in the research areas mentioned above.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
C. Klink, L. Olesen, F. Besenbacher, I. Stensgaard, E. Laegsgaard, N.D. Lang: Phys. Rev. Lett. 71, 4350 (1993)
L. Ruan, I. Stensgaard, F. Besenbacher, E. Laegsgaard: J. Vac. Sci. Technol. B 12, 1772 (1994)
S.J. Murray, D.A. Brooks, F.M. Leibsle, R.D. Diehl, R. McGrath: Surf. Sci. 314, 307 (1994)
R. Berndt, J.K. Gimzewski, R.R. Schüttler: Surf. Sci. 310, 85 (1994)
N.D. Lang: Phys. Rev. Lett. 58, 45 (1987)
X.X. Chen, E.R. Frank, R.J. Hamers: J. Vac. Sci. Technol. A 12, 2091 (1994)
N.D. Lang: Phys. Rev. Lett. 56, 1164 (1986)
N.D. Lang: Phys. Rev. B 45, 13599 (1992)
N.D. Lang: Phys. Rev. B 49, 2067 (1994)
I.W. Lyo, Ph. Avouris: Science 253, 173 (1991)
N.D. Lang: Phys. Rev. B 34, 5947 (1986); Phys. Rev. 58, 45 (1988)
D. Drakova, G. Doyen: Surf. Sci. (Proc. ECOSS 15) accepted
W. Kaiser, R. Jaklevic: IBM J. Res. Dev. 30, 411 (1986)
W. Kaiser, R. Jaklevic: Surf. Sci. 181, 55 (1987)
S. Hüfner: Photoelectron Spectroscopy, 2nd edn., Springer Ser. Solid-State Sci., Vol. 82 ( Springer, Berlin, Heidelberg 1996 )
S.L. Hulbert, P.D. Johnson, M. Weinert: Phys. Rev. B 34, 3670 (1986)
F.J. Himpsel, D.E. Eastman: Phys. Rev. B 18, 5236 (1978)
S.G. Louie: Phys. Rev. Lett. 40, 1525 (1978)
J. Wintterlin, J. Wiechers, H. Brune, T. Gritsch, H. Höfer. R.J. Behm: Phys. Rev. Lett. 62, 59 (1989)
V.M. Hallmark, S. Chiang, J.F. Rabolt, J.D. Swalen, R.J. Wilson: Phys. Rev. Lett. 59, 2879 (1987)
Ch. Wöll, S. Chiang, R.J. Wilson, P.H. Lippel: Phys. Rev. B 39, 7988 (1989)
P.H. Lippel, R.J. Wilson, M.D. Miller, Ch. Wöll. S. Chiang: Phys. Rev. Lett. 62, 171 (1989)
D. Drakova, D. Doyen: Phys. Rev. B 49, 13787 (1994)
E. Koetter: Theoretische Untersuchung zum Einfluß der elektronischen und geometrischen Struktur der Spitze in der Raster-Tunnel-Mikroskopie. Dissertation, Technical University of Berlin (1993)
E. Koetter, D. Drakova, G. Doyen: Surf. Sci. 331–333, 679 (1995)
E. Koetter, D. Drakova, G. Doyen: Phys. Rev. B, submitted
U. Dürig, O. Züger: Vacuum 41, 382 (1990)
R.S. Becker, B.S. Swartzentruber, J.S. Vickers, T. Klitsner: Phys. Rev. 39, 1633 (1989)
R.M. Feenstra, A.J. Slavin: Surf. Sci. 251 /252, 401 (1991)
Eis. Hirschorn, D.S. Lin, F.M. Leibsle, A. Samsavar, T.-C. Chiang: Phys. Rev. B 44, 1403 (1991)
T. Yokotsuka, S. Kono, S. Suzuki, T. Sagawa: J. Phys. Soc. Jpn. 53, 696 (1984)
D. Drakova, G. Doyen: Prog. Surf. Sci. 46, 251 (1994)
D.M. Eigler, E.K. Schweizer: Nature 344, 524 (1991)
D.M. Eigler, C.P. Lutz, W.E. Rudge: Nature 352, 600 (1991)
M.F. Crommie, C.P. Lutz, D,M. Eigler: Science 262, 218 (1993)
I.W. Lyo, P. Avouris: J. Chem. Phys. 93, 4479 (1990); Science 253, 173
H. Uchida, D. Huang, F. Grey, M. Aono: Phys. Rev. Lett. 70, 2040 (1993)
A. Kobayashi, F. Grey, R.S. Williams, M. Aono; Science 259, 1724 (1993)
K. Hirose, M. Tsukada: Phys. Rev. Lett. 73, 150 (1994)
K. Hirose, M. Tsukada: Phys. Rev. B 51, 5278 (1995)
M. Tsukada, N. Kobayashi, K. Hirose: In Computational Physics as a New Frontier in Condensed Matter Research (The Phys. Soc. Jpn. 1995) pp. 34–41 N. Kobayashi, K. Hirose, M. Tsukada: Surf. Sci. 348, 299 (1996)
D. Sokolovski, I.N.L. Connor: Phys. Rev. A 47, 4677 (1993); Solid State Commun. 89, 475 (1994)
D. Sokolovski, S. Brouard, J.N.L. Connor: Phys. Rev. A 50, 1240 (1994)
H.A. Fertig: Phys. Rev. Lett. 65, 2321 (1990); Phys. Rev. B 47, 1346 (1993)
G. Iannaccone, B. Pellegrini: Phys. Rev. B 49, 16548 (1994)
S. Brouard, R. Sala, J.G. Muga: Phys. Rev. A 47, 4312 (1994)
C.R. Leavens: Phys. Lett. A 197, 88 (1995)
C.R. Leavens: Phys. Lett. A 178, 27 (1993)
M. Daumer, D. Dürr, S. Goldstein, N. Zanghi: Scattering and the role of operators in Bohmian mechanics, in On Three Levels: The Mathematical Physics of Micro, Meso, and Macro Phenomena, ed. by M. Fannes, C. Maes, A. Verbeure ( Plenum, New York 1994 )
W.R. McKinnon, C.R. Leavens: Phys. Rev. A 51, 2748 (1995)
D. Dürr, S. Goldstein, N. Zanghi: Phys. Lett. A 172, 6 (1992)
A. Valentini: Phys. Lett. A 156, 5 (1991); ibid. A 1581 (1991)
A recent survey has been given by A.A. Gewirth and H. Siegenthaler (eds.): Nanoscale Probes of the Solid/Liquid Interface, NATO ASI Ser. E, Vol. 288 ( Kluwer, Dordrecht 1995 )
J.L. Hutter, J. Bechhoefer: J. Appl. Phys. 73, 4123 (1993)
F. Ohnesorge, G. Binnig: Science 260, 1451 (1993)
L. Olsson, P. Tengvall, R. Wigren, R. Erlandsson: Ultramicroscopy 42–44, 73
J.L. Hutter, J. Bechhoefer: J. Vac. Sei. Technol. B 12, 2251 (1994)
S.J. O’Shea, M.E. Weiland, J. B. Pethica: Chem. Phys. Lett. 223, 336 (1994)
S.J. O’Shea, M.E. Weiland, T. Rayment: Appl. Phys. Lett. 60, 2356 (1992)
S.J. O’Shea, M.E. Weiland, T. Rayment: Appl. Phys. Lett. 61, 2240 (1992)
M. Mantel, Y.S. Rabinovich, J.P. Wightman, R.H. Yoon: J. Colloid Interface Sci. 170, 203 (1995)
S. Akari, D. Horn, H. Keller, W. Schrepp: Adv. Mater. 7, 549 (1995)
S.P. Jarvis, J.B. Pethica: In Forces in Scanning Probe Methods, ed. by H.-J. Güntherodt, D. Anselmetti, E. Meyer, NATO ASI Ser. E, Vol. 286 ( Kluwer, Dordrecht 1995 )
R.L. Alley, K. Komvopoulos, R.T. Howe: J. Appi. Phys. 76, 5731 (1994)
U. Landman, W.D. Luedtke, M.W. Ribarsky: J. Vac. Sci. Technol. A 7, 2829 (1989)
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 1996 Springer-Verlag Berlin Heidelberg
About this chapter
Cite this chapter
Wiesendanger, R., Güntherodt, HJ. (1996). Recent Developments. In: Wiesendanger, R., Güntherodt, HJ. (eds) Scanning Tunneling Microscopy III. Springer Series in Surface Sciences , vol 29. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-80118-1_13
Download citation
DOI: https://doi.org/10.1007/978-3-642-80118-1_13
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-60824-0
Online ISBN: 978-3-642-80118-1
eBook Packages: Springer Book Archive