Simulation of Thermally Shunted Multiple-Emitter-Finger AlGaAs/GaAs Heterojunction Bipolar Transistors Using A Finite Element Code

  • S. Kokkalera
  • C. T. Tsai
  • L. L. Liou
  • J. Barrette
  • C. Bozada
  • R. Dettmer
  • B. Fitch
  • M. Mack
  • J. Sewell
Conference paper

Abstract

Heterojunction bipolar transistors (HBTs) are capable of microwave operation at high current densities and are being implemented in microwave high power amplifiers. The heat generated during device operation is dissipated through the GaAs substrate. Because of its poor thermal conductivity, the junction temperature rise can be large enough to significantly degrade the high performance of the device. The operation of AlGaAs/GaAs is usually thermally-limited.

Keywords

Microwave GaAs Poly Imide Imide Arsenide 

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References

  1. [1]
    W. Liu, S. Nelson, D. G. Hill and A. Khatibzadeh, “Current collapse in Microwave Multifinger Heterojunction Bipolar Transistors Operated at Very High Power Densities,” IEEE Trans. on Electron Devices, vol. 40, pp. 1917–1927 (1993).CrossRefGoogle Scholar
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    L. L. Liou and B. Bayraktaroglu, “Thermal Stability Analysis of AlGaAs/GaAs Heteroj unction Bipolar Transistors with Multiple Emitter Fingers,” IEEE trans. on Electron Devices, vol. 41 pp 629–636, (1994).CrossRefGoogle Scholar
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    B. Bayraktaroglu, J. Barrette, L. Kehias, C. I. Huang, R. Fitch, R. Neidhard and R. Scherer, “Very High-Power-Density CW operation of AlGaAs/GaAs Microwave Heterojunction Bipolar Transistors,” IEEE Electron Device Letters, Vol. 14, 493–495, (1993).CrossRefGoogle Scholar
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    L. L. Liou, B. Bayraktaroglu, C. I. Huang and J. Barrette, “The Effect of Thermal Shunt on the Current Instability of Multiple-Emitter-Finger Heterojunction Bipolar Transistors,” IEEE 1993, BCTM proceedings, pp. 253–256, (1993).Google Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 1995

Authors and Affiliations

  • S. Kokkalera
    • 1
  • C. T. Tsai
    • 1
  • L. L. Liou
    • 2
  • J. Barrette
    • 2
  • C. Bozada
    • 2
  • R. Dettmer
    • 2
  • B. Fitch
    • 2
  • M. Mack
    • 2
  • J. Sewell
    • 2
  1. 1.Florida Atlantic UniversityBoca RatonUSA
  2. 2.Wright LaboratorySolid State Electronics DirectorateWPAFBUSA

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