Surface Modification with a Scanning Proximity Probe Microscope

  • U. Staufer
Part of the Springer Series in Surface Sciences book series (SSSUR, volume 28)

Abstract

This chapter discusses how a scanning proximity probe microscope (SXM1) can be used for the modification of a surface, this being a subject that microscopists usually seek to avoid.

Keywords

Graphite Tungsten GaAs Explosive Drilling 

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© Springer-Verlag Berlin Heidelberg 1995

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  • U. Staufer

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