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Related Scanning Techniques

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Scanning Tunneling Microscopy II

Part of the book series: Springer Series in Surface Sciences ((SSSUR,volume 28))

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Abstract

In the preceding chapters we have seen how the scanning tunneling microscope (STM) and the scanning force microscope (SFM) have been applied to a wide range of problems in chemistry, physics and biology. The STM has taught us that it is possible to stabilize and scan a fine probe tip (only one atom across at its very end) by using piezoelectric scanners coupled with electronic feedback techniques [6.1]. In order to achieve this sort of precise control of the tip-sample spacing however, one needs to be able to derive an electronic feedback signal that varies rapidly as the tip-sample distance is varied. In the STM we monito the rapid (almost exponential) decrease in tunnel current with increasing tip-sample spacing to achieve this end. However, as we will see here, the same scanning and feedback principles can also be applied to other types of interactions than the tunneling current between tip and sample. All these new microscopies have the characteristic that their resolution is not determined by any wavelength that is used for the interaction as in conventional microscopy (the so called Abbe limit [6.2]) but rather by the size of the interacting probe that hovers over the sample surface to scan the image. These microscopies therefore come under the general class of super-resolution microscopy.

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Authors
  1. H. K. Wickramasinghe
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Editors and Affiliations

  1. Institute of Applied Physics, University of Hamburg, Jungiusstrasse 11, D-20355, Hamburg, Germany

    Roland Wiesendanger

  2. Department of Physics, University of Basel, Klingelbergstrasse 82, CH-4056, Basel, Switzerland

    Hans-Joachim Güntherodt

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© 1995 Springer-Verlag Berlin Heidelberg

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Wickramasinghe, H.K. (1995). Related Scanning Techniques. In: Wiesendanger, R., Güntherodt, HJ. (eds) Scanning Tunneling Microscopy II. Springer Series in Surface Sciences, vol 28. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-79366-0_6

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  • DOI: https://doi.org/10.1007/978-3-642-79366-0_6

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-58589-3

  • Online ISBN: 978-3-642-79366-0

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