Magnetic Force Microscopy (MFM)

  • P. Grütter
  • H. J. Mamin
  • D. Rugar
Part of the Springer Series in Surface Sciences book series (SSSUR, volume 28)

Abstract

The success of the scanning tunneling microscope (STM) has stimulated the development of a number of related “scanning probe” microscopes, which are based on mechanically scanning a sharp tip over a sample surface. One of the most successful of these new microscopes is the scanning force microscope, invented by Binnig, Quoteand Gerberin 1986 [5.1]. The basic principle of the force microscope is simple. A sharp tip is mounted on a cantilever spring. Forces from the sample act on the tip and cause some measurable change in the cantilever status, such as deflection or shift in resonant frequency. To form an image, the sample-tip interaction is mapped as a function of position by mechanically scanning the sample relative to the tip in a raster pattern. In the original work by Binniget al., the primary motivation was to observe atomic forces between tip and sample. When operating with the tip and sample in contact, atomic-scale surface topography can be imaged [5.2]. This type of “atomic force microscopy” (AFM) has been discussed in Chap. 4.

Keywords

Vortex Nickel Anisotropy Zirconia Cobalt 

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© Springer-Verlag Berlin Heidelberg 1995

Authors and Affiliations

  • P. Grütter
  • H. J. Mamin
  • D. Rugar

There are no affiliations available

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