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STM on Layered Materials

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Scanning Tunneling Microscopy I

Part of the book series: Springer Series in Surface Sciences ((SSSUR,volume 20))

Abstract

Layered materials [6.1] exhibit many properties which make them special with regards to STM studies and in scanning probe microscopy in general. Thus an entire chapter is devoted to STM investigations of layered materials, although, depending on the electrical conductivity of the layered materials, these investigations could also have been included in the chapters on metals or semiconductors. In contrast, insulating layered materials cannot be studied by STM but only by its relative, atomic force microscopy (AFM). Such investigations are reported in the chapter entitled “Scanning Force Microscopy” in the second volume on “Scanning Tunneling Microscopy”.

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  1. R. Wiesendanger
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  2. D. Anselmetti
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Editors and Affiliations

  1. Department of Physics, University of Basel, Klingelbergstrasse 82, CH-4056, Basel, Switzerland

    Hans-Joachim Güntherodt

  2. Institute of Applied Physics, Universität Hamburg, Jungiusstrasse 11, D-20355, Hamburg, Germany

    Roland Wiesendanger

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Wiesendanger, R., Anselmetti, D. (1994). STM on Layered Materials. In: Güntherodt, HJ., Wiesendanger, R. (eds) Scanning Tunneling Microscopy I. Springer Series in Surface Sciences, vol 20. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-79255-7_6

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