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Applications of Synchrotron Radiation pp 127–169Cite as

Structure Determination of Molecular Adsorbates Using Photoelectron Diffraction

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Part of the book series: Springer Series in Surface Sciences ((SSSUR,volume 35))

Abstract

This chapter is concerned with photoelectron diffraction in both its scanned-energy and scanned-angle forms. The phenomenon itself and its possible use as a structural tool was first described by Liebsch in 1974 in a theoretical study [4.1]. The first experimental studies were performed independently by three groups in 1978 [4.2-4]. As in Surface Extended Absorption Fine Structure (SEXAFS) the technique is based on the interference of photoemitted electron waves and does not have the requirement of long-range order, but there are distinct differences between the two experiments, as will be discussed below. The scanned energy form (referred to here as PhD) also requires the use of synchrotron radiation, whereas the scanned angle variant at higher photoelectron kinetic energies can be performed with laboratory sources. The latter is often referred to as XPD (X-ray Photoelectron Diffraction), but in the case of adsorbed molecules is largely restricted to the determination of bond directions. The scanned energy form of the method, on the other hand, has the potential of delivering much more quantitative geometric information and, in some cases, even providing an almost complete structural characterisation [4.5, 6]. The present chapter therefore concentrates on the scanned-energy experiment and the reader is referred to two recent review articles for more exhaustive accounts of XPD [4.7, 8].

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  1. A. M. Bradshaw
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  2. D. P. Woodruff
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  1. Institut für Festkörperforschung, KFA Jülich, 52425, Jülich, Germany

    Wolfgang Eberhardt

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Bradshaw, A.M., Woodruff, D.P. (1995). Structure Determination of Molecular Adsorbates Using Photoelectron Diffraction. In: Eberhardt, W. (eds) Applications of Synchrotron Radiation. Springer Series in Surface Sciences, vol 35. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-79024-9_4

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