Abstract
Minerals in rocks are usually rather imperfect, but individual minerals which have been allowed to grow without hindrance and with free surfaces, such as in pegmatites or druses, may be highly perfect. X-ray topography is an imaging technique which is very sensitive to local strains and which is therefore applied to perfect or nearly perfect crystals. It enables one to visualize and to characterize defects such as dislocations, growth bands, growth sector boundaries, low angle grain boundaries, stacking faults, twin boundaries, etc. It has been used successfully to assess the crystalline perfection of many types of minerals, carbonates (calcite, dolomite, magnesite, cerussite), quartz, silicates (beryl, topaz, spodumene, orthose), diamond, fluorite, phosphates (apatite), etc. The main motivation for such studies is the determination of the growth history of the minerals and the understanding of their genesis. But they are also very useful to determine the characteristics of the defects responsible for the deformation of minerals.
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Authier, A., Zarka, A. (1994). X-Ray Topographic Study of the Real Structure of Minerals. In: Marfunin, A.S. (eds) Advanced Mineralogy. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-78523-8_12
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DOI: https://doi.org/10.1007/978-3-642-78523-8_12
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