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Desorption Induced by Electronic Transitions DIET V pp 212–217Cite as

Atomic Force Microscopy of Surface Defects on NaCl(100)

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Part of the book series: Springer Series in Surface Sciences ((SSSUR,volume 31))

Abstract

Scanning force microscopy reveals features interpreted as chloride ion vacancies or substitutional surface impurities on NaCl (100) at room temperature. Monatomic step edges have been imaged as well. Using an evacuable chamber backfilled with helium at controlled humidity, studies of image resolution versus ambient moisture and tip force are described. The goal of this work is an atomresolving probe of surface modifications resulting from radiation-induced desorption and damage phenomena.

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Author information

Authors and Affiliations

  1. Department of Physics, Wake Forest University, Winston-Salem, NC, 27109, USA

    R. T. Williams, R. M. Wilson & G. P. Williams Jr.

Authors
  1. R. T. Williams
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  2. R. M. Wilson
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  3. G. P. Williams Jr.
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Editor information

Editors and Affiliations

  1. Sandia National Laboratories, Albuquerque, P.O. Box 5800, Albuquerque, NM, 87185, USA

    Alan R. Burns , Ellen B. Stechel  & Dwight R. Jennison ,  & 

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© 1993 Springer-Verlag Berlin Heidelberg

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Williams, R.T., Wilson, R.M., Williams, G.P. (1993). Atomic Force Microscopy of Surface Defects on NaCl(100). In: Burns, A.R., Stechel, E.B., Jennison, D.R. (eds) Desorption Induced by Electronic Transitions DIET V. Springer Series in Surface Sciences, vol 31. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-78080-6_33

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  • DOI: https://doi.org/10.1007/978-3-642-78080-6_33

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-78082-0

  • Online ISBN: 978-3-642-78080-6

  • eBook Packages: Springer Book Archive

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