Abstract
Energetic ion species desorption from Al(200nm)/sapphire, Ag(10nm)/Al(200nm)/sapphire and Al(111) targets has been measured tor 244 and 320 nm laser irradiation. The product kinetic energy distribution (KED) for samples irradiated with 244 nm light, for Ag+ and the impurity species K+ resemble the KED of Al+ desorbed from Al(111) and Al/sapphire (< KE > ≈3–4 eV). However, for resonance excitation (320 nm) of the Ag adlayer, all product KEDs shift to lower energy (< KE > ≤1 eV). These results imply that the excitation which leads to ion KE is not due to a local excitation process.
Aerospace Sponsored Research
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
H. Helvajian, and R. Welle, J. Chem. Phys. 91, 2616 (1989).
H-S Kim, and H. Helvajian, J. Phys. Chem. 95, 6623 (1991).
L. Wiedeman, and H. Helvajian, J. Appl. Phys. 70, 4513 (1991).
H-S Kim, H. Helvajian, “Laser Ablation Mechanisms and Applications,” J. C. Miller, and R. R Haglund, Jr., Eds. (Springer-Verlag, NY, 1991) pg. 87.
L. Wiedeman, H-S Kim, and H. Helvajian, Mat. Res. Soc. Symp. Proc. 201, 575 (1991).
H. Ehrenreich, and H. R. Phillip, Phys. Rev. 128, 1622 (1962).
E. T. Arakawa, I. Lee, and T. A. Calicott, “Laser Ablation Mechanisms and Applications,” J. C. Miller, and R. R Haglund, Jr., Eds. (Springer-Verlag, NY, 1991) pg. 82.
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 1993 Springer-Verlag Berlin Heidelberg
About this paper
Cite this paper
Kim, HS., Wiedeman, L., Helvajian, H. (1993). UV Pulsed Laser Desorption from Ag/Al/Sapphire Films: Changes in the Ion Desorption Process for Excitations near the Ag d-Band Threshold. In: Burns, A.R., Stechel, E.B., Jennison, D.R. (eds) Desorption Induced by Electronic Transitions DIET V. Springer Series in Surface Sciences, vol 31. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-78080-6_15
Download citation
DOI: https://doi.org/10.1007/978-3-642-78080-6_15
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-78082-0
Online ISBN: 978-3-642-78080-6
eBook Packages: Springer Book Archive